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宁波材料技术与工程研... [4]
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Effective gettering of in-situ phosphorus-doped polysilicon passivating contact prepared using plasma-enhanced chemical-vapor deposition technique
期刊论文
SOLAR ENERGY MATERIALS AND SOLAR CELLS, 2020, 卷号: 206
作者:
Wang, Zhixue
;
Liu, Zunke
;
Liao, Mingdun
;
Huang, Dandan
;
Guo, Xueqi
收藏
  |  
浏览/下载:22/0
  |  
提交时间:2020/12/16
SILICON SOLAR-CELLS
CRYSTALLINE SILICON
HYDROGEN PASSIVATION
SURFACE PASSIVATION
THIN-FILM
LAYER
IRON
THICKNESS
TRANSPORT
LIFETIME
Over 16.7% Efficiency Organic-Silicon Heterojunction Solar Cells with Solution-Processed Dopant-Free Contacts for Both Polarities
期刊论文
ADVANCED FUNCTIONAL MATERIALS, 2018, 卷号: 28, 期号: 34
作者:
Ye, Jichun
;
Tang, Jiang
;
Gao, Pingqi
;
Wan, Yimao
;
He, Jian
收藏
  |  
浏览/下载:34/0
  |  
提交时间:2018/12/04
Electron-selective Contacts
Open-circuit Voltage
Silicon/organic Heterojunction
Sulfonate) Film
Conductivity
Devices
Surface
Enhancement
Direct quantification of mechanical responses of TiSiN/Ag multilayer coatings through uniaxial compression of micropillars
期刊论文
VACUUM, 2018, 卷号: 156, 页码: 310-316
作者:
Dang, Chaoqun
;
Olugbade, Temitope
;
Fan, Sufeng
;
Zhang, Hongti
;
Gao, Libo
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  |  
浏览/下载:261/0
  |  
提交时间:2018/12/04
Silicon Nanopillars
Fracture
Size
Microstructure
Deformation
Behavior
Surface
Films
Cu
Plasticity
Direct quantification of mechanical responses of TiSiN/Ag multilayer coatings through uniaxial compression of micropillars
期刊论文
VACUUM, 2018, 卷号: 156, 页码: 310-316
作者:
Dang, Chaoqun
;
Olugbade, Temitope
;
Fan, Sufeng
;
Zhang, Hongti
;
Gao, Libo
收藏
  |  
浏览/下载:265/0
  |  
提交时间:2018/12/04
Silicon Nanopillars
Fracture
Size
Microstructure
Deformation
Behavior
Surface
Films
Cu
Plasticity
Deformation behavior of single crystal silicon induced by laser shock peening
会议论文
2nd International Symposium on Laser Interaction with Matter (LIMIS), Xian, PEOPLES R CHINA, SEP 09-12, 2012
作者:
Liu YX(柳沅汛)
;
Wu XQ(吴先前)
;
Wang X(王曦)
;
Wei YP(魏延鹏)
;
Huang CG(黄晨光)
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  |  
浏览/下载:127/0
  |  
提交时间:2013/12/12
Laser shock peening
single crystal silicon
plastic deformation
surface morphology
residual stress
Studies on surface roughness and growth mechanisms of microcrystalline silicon films by grazing incidence X-ray reflectivity
期刊论文
ACTA PHYSICA SINICA, 2007, 卷号: 56, 期号: 4, 页码: 2422-2427
作者:
Zhou, BQ
;
Liu, FZ
;
Zhu, MF
;
Zhou, YQ
;
Wu, ZH
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  |  
浏览/下载:17/0
  |  
提交时间:2016/06/29
grazing incidence X-ray reflectivity
microcrystalline silicon film
surface roughness
growth mechanism
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