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科研机构
半导体研究所 [20]
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期刊论文 [19]
会议论文 [1]
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2011 [4]
2010 [1]
2008 [1]
2007 [1]
2006 [1]
2005 [1]
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半导体材料 [20]
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Optimization of double nanocrystalline silicon p-layers for amorphous silicon solar cells
期刊论文
cailiao gongcheng/journal of materials engineering, 2011, 期号: 8, 页码: 5-7+13
Liu, Shi-Yong
;
Zeng, Xiang-Bo
;
Peng, Wen-Bo
;
Yao, Wen-Jie
;
Xie, Xiao-Bing
;
Yang, Ping
;
Wang, Chao
;
Wang, Zhan-Guo
收藏
  |  
浏览/下载:32/0
  |  
提交时间:2012/06/14
Amorphous films
Chemical vapor deposition
Energy gap
High resolution electron microscopy
High resolution transmission electron microscopy
Hydrogen
Nanocrystalline silicon
Optical band gaps
Plasma deposition
Plasma enhanced chemical vapor deposition
Raman spectroscopy
Semiconducting silicon compounds
Solar power generation
Thin films
Transmission electron microscopy
Fabrication and property investigation of the highly ordered TiO2 nanotube arrays
期刊论文
gao xiao hua xue gong cheng xue bao/journal of chemical engineering of chinese universities, 2011, 卷号: 25, 期号: 3, 页码: 507-512
Lan, Yu-Wei
;
Zhou, Li-Ya
;
Tong, Zhang-Fa
;
Pang, Qi
;
Leng, Li-Min
;
Han, Jian-Peng
;
Wang, Fan
收藏
  |  
浏览/下载:20/0
  |  
提交时间:2012/06/14
Anodic oxidation
Azo dyes
Degradation
Ethylene
Ethylene glycol
Fabrication
Mercury(metal)
Photocatalysis
Photodegradation
Scanning electron microscopy
Titanium
Titanium dioxide
X ray diffraction
X ray diffraction analysis
Fabrication, morphology and mechanical properties of Al2O3-Al graded coatings on China low activation martensitic steel substrates
期刊论文
surface and interface analysis, 2011
Song, Binbin
;
Wu, Ping
;
Chen, Sen
;
Zhang, Shiping
;
Yan, Dan
;
Xue, Lian
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  |  
浏览/下载:54/0
  |  
提交时间:2012/06/14
Adhesion
Auger electron spectroscopy
Fabrication
Hardness
Magnetron sputtering
Martensitic steel
Morphology
Nanoindentation
Protective coatings
Scanning electron microscopy
Silicon wafers
X ray photoelectron spectroscopy
Structures and optical characteristics of InGaN quantum dots grown by MBE
期刊论文
xiyou jinshu cailiao yu gongcheng/rare metal materials and engineering, 2011, 卷号: 40, 期号: 11, 页码: 2030-2032
Wang, Baozhu
;
Yan, Cuiying
;
Wang, Xiaoliang
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  |  
浏览/下载:22/0
  |  
提交时间:2012/06/14
Atomic force microscopy
Gallium nitride
Molecular beam epitaxy
Optical materials
Optical properties
Reflection high energy electron diffraction
Sapphire
Substrate temperature dependence of ZnTe epilayers grown on GaAs(001) by molecular beam epitaxy
期刊论文
journal of crystal growth, 2010, 卷号: 312, 期号: 9, 页码: 1491-1495
Zhao J (Zhao Jie)
;
Zeng YP (Zeng Yiping)
;
Liu C (Liu Chao)
;
Li YB (Li Yanbo)
收藏
  |  
浏览/下载:148/33
  |  
提交时间:2010/06/04
Reflection high-energy electron diffraction
Atomic force microscopy
Molecular beam epitaxy
Zinc compounds
Semiconducting II-VI materials
Effect of Nitridation on Morphology, Structural Properties and Stress of AIN Films
期刊论文
chinese physics letters, 2008, 卷号: 25, 期号: 12, 页码: 4364-4367
作者:
Wei HY
;
Jiao CM
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  |  
浏览/下载:178/45
  |  
提交时间:2010/03/08
TRANSMISSION ELECTRON-MICROSCOPY
WURTZITE-TYPE CRYSTALS
VAPOR-PHASE EPITAXY
INTRINSIC STRESS
SAPPHIRE SURFACE
THIN-FILMS
GAN
GROWTH
DIFFRACTION
MECHANISM
Scanning electron microscopy observation of in-device InAs/AlAs quantum dots by selective etching of capping layers
期刊论文
modern physics letters b, 2007, 卷号: 21, 期号: 14, 页码: 859-866
Sun, J
;
Zhou, DY
;
Li, RY
;
Zhao, C
;
Ye, XL
;
Xu, B
;
Chen, YH
;
Wang, ZG
收藏
  |  
浏览/下载:65/5
  |  
提交时间:2010/03/08
III-V semiconductors
quantum dots
scanning electron microscopy
selective etching
Electrical properties of B-doped polycrystalline silicon thin films prepared by rapid thermal chemical vapour deposition
期刊论文
thin solid films, 2006, 卷号: 497, 期号: 1-2, 页码: 157-162
Ai B
;
Shen H
;
Liang ZC
;
Chen Z
;
Kong GL
;
Liao XB
收藏
  |  
浏览/下载:48/0
  |  
提交时间:2010/04/11
chemical vapour deposition
electrical properties and measurements
scanning electron microscopy
polycrystalline silicon
GRAIN-BOUNDARIES
STATES
Structural and optical properties of InAs/In0.52Al0.48As self-assembled quantum wires on InP(001)
期刊论文
journal of crystal growth, 2005, 卷号: 284, 期号: 3-4, 页码: 306-312
Wang YL
;
Chen YH
;
Wu J
;
Lei W
;
Wang ZG
;
Zeng YP
收藏
  |  
浏览/下载:124/70
  |  
提交时间:2010/03/17
high-resolution transmission electron microscopy
Microstructural and compositional characteristics of GaN films grown on a ZnO-buffered Si(111) wafer
期刊论文
micron, 2004, 卷号: 35, 期号: 6, 页码: 475-480
Luo, XH
;
Wang, RM
;
Zhang, XP
;
Zhang, HZ
;
Yu, DP
;
Luo, MC
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  |  
浏览/下载:145/32
  |  
提交时间:2010/03/09
transmission electron microscopy
electron energy loss spectroscopy
molecular beam epitaxy
gallium nitride
CHEMICAL-VAPOR-DEPOSITION
EPITAXY
LAYER
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