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浏览/检索结果: 共2条，第1-2条 帮助 限定条件 发表日期：2010    专题：长春光学精密机械与物理研究所    第一署名单位    第一作者单位    通讯作者单位     已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 The novel facet coating technology for 808nm semiconductor laser (EI CONFERENCE) 会议论文 2010 Academic Symposium on Optoelectronics and Microelectronics Technology and 10th Chinese-Russian Symposium on Laser Physics and Laser Technology, RCSLPLT/ASOT 2010, July 28, 2010 - August 1, 2010, Harbin, China Li Z.; Qin L.; Liu Y.; Wang L. 收藏  |  浏览/下载：17/0  |  提交时间：2013/03/25 A novel facet coating technology is presented by studying catastrophic optical mirror damage mechanism of semiconductor laser. In this technology  semiconductor laser are cleaved in the air  and the surface oxide layer is removed with a low energy ion source  flowed immediately by coating the facet with thin ZnSe layer of 20 nm. The function of this layer is to protect semiconductor laser facet  and prevent impurity particles diffusing to the facet. Finally the facet is coated with oxidative optical film. The test results show that the output power of the semiconductor laser with the ZnSe coated layer is 13% higher than that of the Si coated layer  and 47% higher than that of the oxide coated film. The device coated oxide film is damaged when current is 4.5 A  and the device coated with Si layer is damaged when current is 5.5 A  the final failed device is coated with ZnSe layer. In conclusion  the method of coating ZnSe layer on the semiconductor laser facet can prevent effectively the catastrophic optical mirror damage  and increase the output power of semiconductor lasers. 2010 IEEE.   Inhibition of electromagnetic interference in control system based on DSP of high-power TEA CO2 laser (EI CONFERENCE) 会议论文 2010 International Conference on Computer, Mechatronics, Control and Electronic Engineering, CMCE 2010, August 24, 2010 - August 26, 2010, Changchun, China Wang H.-Q.; Meng F.-J.; Guo L.-H. 收藏  |  浏览/下载：35/0  |  提交时间：2013/03/25 The strong electromagnetic interference (EMI) generated in high-power TEA C02 laser system mainly comes from main discharge circuit  pulse spark switch and power supply. Such strong EMI causes great damage and interference to the control system based on DSP. In this paper  we present the interference sources and their distribution and propose the methods of anti-interference. Measures for hardware design include weakening transient ground potential difference by using equipotential lines between devices  using signal isolation interface to inhibit the transient ground potential interference  and rational layout  shielding and filtering to the control system. And methods for software design include range-limited filter  self-diagnosis and self-repair for the critical data and anti-interference during abnormal reset. The EMI has been inhibited effectively by the anti-interference method proposed above. The result shows that: the software anti-interference method is as important as the hardware anti-interference method for the control system in a complex environment of strong EMI. 2010 IEEE.