CORC

浏览/检索结果: 共11条,第1-10条 帮助

限定条件                
已选(0)清除 条数/页:   排序方式:
Enhanced effect of diffused Ohmic contact metal atoms for device scaling in AlGaN/GaN heterostructure field-effect transistors 期刊论文
SUPERLATTICES AND MICROSTRUCTURES, 2017, 卷号: 103, 页码: 113-120
作者:  Liu, Huan;  Cheng, Aijie;  Lin, Zhaojun;  Cui, Peng;  Liu, Yan
收藏  |  浏览/下载:5/0  |  提交时间:2019/12/11
ELM model for power system transient stability assessment 期刊论文
Proceedings - 2017 Chinese Automation Congress, CAC 2017, 2017, 卷号: 2017-January, 页码: 5740-5744
作者:  Zhang, Linlin;  Hu, Xiongwei;  Li, Peng;  Shi, Fang;  Yu, Zhihong
收藏  |  浏览/下载:13/0  |  提交时间:2019/12/12
ELM Model for Power System Transient Stability Assessment 会议论文
Chinese Automation Congress (CAC), OCT 20-22, 2017
作者:  Zhang Linlin;  Hu Xiongwei;  Li Peng;  Shi Fang;  Yu Zhihong
收藏  |  浏览/下载:3/0  |  提交时间:2019/12/31
Study of Gate Width Influence on Extrinsic Transconductance in AlGaN/GaN Heterostructure Field-Effect Transistors With Polarization Coulomb Field Scattering 期刊论文
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2016, 卷号: 63, 期号: 10, 页码: 3908-3913
作者:  Yang, Ming;  Lv, Yuanjie;  Feng, Zhihong;  Lin, Wei;  Cui, Peng
收藏  |  浏览/下载:6/0  |  提交时间:2019/12/16
Study of source access resistance at direct current quiescent points for AlGaN/GaN heterostructure field-effect transistors 期刊论文
JOURNAL OF APPLIED PHYSICS, 2016, 卷号: 119, 期号: 22
作者:  Yang, Ming;  Lv, Yuanjie;  Feng, Zhihong;  Lin, Wei;  Cui, Peng
收藏  |  浏览/下载:2/0  |  提交时间:2019/12/16
Effect of Polarization Coulomb Field Scattering on Parasitic Source Access Resistance and Extrinsic Transconductance in AlGaN/GaN Heterostructure FETs 期刊论文
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2016, 卷号: 63, 期号: 4, 页码: 1471-1477
作者:  Yang, Ming;  Lin, Zhaojun;  Zhao, Jingtao;  Cui, Peng;  Fu, Chen
收藏  |  浏览/下载:9/0  |  提交时间:2019/12/16
Demographic and clinical characteristics related to cognitive decline in Alzheimer disease in China: A multicenter survey from 2011 to 2014 期刊论文
MEDICINE, 2016, 卷号: 95, 期号: 26
作者:  Peng, Dantao;  Shi, Zhihong;  Xu, Jun;  Shen, Lu;  Xiao, Shifu
收藏  |  浏览/下载:41/0  |  提交时间:2019/12/16
Influence of different GaN cap layer thicknesses on electron mobility in AlN/GaN heterostructure field-effect transistors 期刊论文
SUPERLATTICES AND MICROSTRUCTURES, 2016, 卷号: 100, 页码: 358-364
作者:  Cui, Peng;  Liu, Huan;  Lin, Zhaojun;  Cheng, Aijie;  Liu, Yan
收藏  |  浏览/下载:7/0  |  提交时间:2019/12/17
Effects of rapid thermal annealing on the electrical properties and the strain of the AlGaN/AlN/GaN heterostructure field-effect transistors with Ni/Au gate electrodes 期刊论文
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2015, 卷号: 121, 期号: 3, 页码: 1271-1276
作者:  Zhao, Jingtao;  Lin, Zhaojun;  Chen, Quanyou;  Yang, Ming;  Cui, Peng
收藏  |  浏览/下载:3/0  |  提交时间:2019/12/17
A study of the impact of gate metals on the performance of AlGaN/AlN/GaN heterostructure field-effect transistors 期刊论文
APPLIED PHYSICS LETTERS, 2015, 卷号: 107, 期号: 11
作者:  Zhao, Jingtao;  Lin, Zhaojun;  Chen, Quanyou;  Yang, Ming;  Cui, Peng
收藏  |  浏览/下载:4/0  |  提交时间:2019/12/17


©版权所有 ©2017 CSpace - Powered by CSpace