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Impacts of Metastable Defect States on Gate Oxide Trapping in Nanoscale MOS Devices 其他
2016-01-01
Mao, Dongyuan; Guo, Shaofeng; Wang, Runsheng; Huang, Ru; Liu, Changze
收藏  |  浏览/下载：1/0  |  提交时间：2017/12/03
Impact of heavy ion irradiation on CMOS current mirrors based on SOI and bulk Si substrates: mismatch and output impedance 期刊论文
SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2015
Wu, Weikang; An, Xia; Tan, Fei; Chen, Yehua; Liu, Jingjing; Zhang, Yao; Zhang, Xing; Shen, Dongjun; Guo, Gang; Huang, Ru
收藏  |  浏览/下载：3/0  |  提交时间：2017/12/03
A Flat Lens with Tunable Phase Gradient by Using Random Access Reconfigurable Metamaterial 期刊论文
ADVANCED MATERIALS, 2015
Zhu, Weiming; Song, Qinghua; Yan, Libin; Zhang, Wu; Wu, Pin-Chieh; Chin, Lip Ket; Cai, Hong; Tsai, Din Ping; Shen, Zhong Xiang; Deng, Tian Wei; Ting, Sing Kwong; Gu, Yuandong; Lo, Guo Qiang; Kwong, Dim Lee; Yang, Zhen Chuan; Huang, Ru; Liu, Ai-Qun; Zheludev, Nikolay
收藏  |  浏览/下载：2/0  |  提交时间：2017/12/03
New insights into the design for end-of-life variability of NBTI in scaled high-��/metal-gate Technology for the nano-reliability era 其他
2015-01-01
Ren, Pengpeng; Wang, Runsheng; Ji, Zhigang; Hao, Peng; Jiang, Xiaobo; Guo, Shaofeng; Luo, Mulong; Duan, Meng; Zhang, Jian F.; Wang, Jianping; Liu, Jinhua; Bu, Weihai; Wu, Jingang; Wong, Waisum; Yu, Shaofeng; Wu, Hanming; Lee, Shiuh-Wuu; Xu, Nuo; Huang, Ru
收藏  |  浏览/下载：6/0  |  提交时间：2017/12/03
New understanding of state-loss in complex RTN: Statistical experimental study, trap interaction models, and impact on circuits 其他
2015-01-01
Zou, Jibin; Wang, Runsheng; Guo, Shaofeng; Luo, Mulong; Yu, Zhuoqing; Jiang, Xiaobo; Ren, Pengpeng; Wang, Jianping; Liu, Jinhua; Wu, Jingang; Wong, Waisum; Yu, Shaofeng; Wu, Hanming; Lee, Shiuh-Wuu; Wang, Yangyuan; Huang, Ru
收藏  |  浏览/下载：5/0  |  提交时间：2017/12/03
On the origin of frequency dependence of single-trap induced degradation in AC NBTI 其他
2015-01-01
Mao, Dongyuan; Guo, Shaofeng; Wang, Runsheng; Liu, Changze; Huang, Ru
收藏  |  浏览/下载：2/0  |  提交时间：2017/12/03
Understanding NBTI-induced dynamic variability in the nano-reliability Era: From devices to circuits 其他
2015-01-01
Wang, Runsheng; Ren, Pengpeng; Liu, Changze; Guo, Shaofeng; Huang, Ru
收藏  |  浏览/下载：2/0  |  提交时间：2017/12/03
Understanding NBTI-induced Dynamic Variability in the nano-Reliability Era: from Devices to Circuits 其他
2015-01-01
Wang, Runsheng; Ren, Pengpeng; Liu, Changze; Guo, Shaofeng; Huang, Ru
收藏  |  浏览/下载：2/0  |  提交时间：2017/12/03
On the Origin of Frequency Dependence of Single-Trap Induced Degradation in AC NBTI 其他
2015-01-01
Mao, Dongyuan; Guo, Shaofeng; Wang, Runsheng; Liu, Changze; Huang, Ru
收藏  |  浏览/下载：2/0  |  提交时间：2017/12/03
Impact of heavy ion irradiation on CMOS current mirrors based on SOI and bulk Si substrates: mismatch and output impedance 其他
2015-01-01
Wu, Weikang; An, Xia; Tan, Fei; Chen, Yehua; Liu, Jingjing; Zhang, Yao; Zhang, Xing; Shen, Dongjun; Guo, Gang; Huang, Ru
收藏  |  浏览/下载：4/0  |  提交时间：2017/12/04

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