CORC

浏览/检索结果: 共1条,第1-1条 帮助

限定条件    
已选(0)清除 条数/页:   排序方式:
HIGH-RESOLUTION ELECTRON-MICROSCOPY ANALYSIS OF ION-BEAM INDUCED ANNEALING OF MEV AS+ ION-IMPLANTED SILICON 其他
1991-01-01
ZHANG, BX; WANG, ZL; QI, L; ZHANG, PJ; ZHENG, JG; WANG, LC; DU, AY
收藏  |  浏览/下载:4/0  |  提交时间:2015/11/16


©版权所有 ©2017 CSpace - Powered by CSpace