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New insights into the design for end-of-life variability of NBTI in scaled high-��/metal-gate Technology for the nano-reliability era 其他
2015-01-01
Ren, Pengpeng; Wang, Runsheng; Ji, Zhigang; Hao, Peng; Jiang, Xiaobo; Guo, Shaofeng; Luo, Mulong; Duan, Meng; Zhang, Jian F.; Wang, Jianping; Liu, Jinhua; Bu, Weihai; Wu, Jingang; Wong, Waisum; Yu, Shaofeng; Wu, Hanming; Lee, Shiuh-Wuu; Xu, Nuo; Huang, Ru
收藏  |  浏览/下载:6/0  |  提交时间:2017/12/03
Novel voltage step stress (VSS) technique for fast lifetime prediction of hot carrier degradation 其他
2014-01-01
Feng, Xixiang; Ren, Pengpeng; Ji, Zhigang; Wang, Runsheng; Sutaria, Ketul B.; Cao, Yu; Huang, Ru
收藏  |  浏览/下载:4/0  |  提交时间:2015/11/13
Gate-Modulated Photoresponse in Graphene Field-Effect Transistors 其他
2013-01-01
Wei, Zijun; Wang, Zhigang; Zhao, Huabo; Ye, Tianyang; Ren, Liming; Guo, Jian; Jia, Yuehui; Zhang, Zhaohui; Fu, Yunyi; Huang, Ru; Zhang, Xing
收藏  |  浏览/下载:4/0  |  提交时间:2015/11/13


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