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CORC

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Impacts of Metastable Defect States on Gate Oxide Trapping in Nanoscale MOS Devices 其他
2016-01-01
Mao, Dongyuan; Guo, Shaofeng; Wang, Runsheng; Huang, Ru; Liu, Changze
收藏  |  浏览/下载：1/0  |  提交时间：2017/12/03
New insights into the design for end-of-life variability of NBTI in scaled high-��/metal-gate Technology for the nano-reliability era 其他
2015-01-01
Ren, Pengpeng; Wang, Runsheng; Ji, Zhigang; Hao, Peng; Jiang, Xiaobo; Guo, Shaofeng; Luo, Mulong; Duan, Meng; Zhang, Jian F.; Wang, Jianping; Liu, Jinhua; Bu, Weihai; Wu, Jingang; Wong, Waisum; Yu, Shaofeng; Wu, Hanming; Lee, Shiuh-Wuu; Xu, Nuo; Huang, Ru
收藏  |  浏览/下载：6/0  |  提交时间：2017/12/03
New understanding of state-loss in complex RTN: Statistical experimental study, trap interaction models, and impact on circuits 其他
2015-01-01
Zou, Jibin; Wang, Runsheng; Guo, Shaofeng; Luo, Mulong; Yu, Zhuoqing; Jiang, Xiaobo; Ren, Pengpeng; Wang, Jianping; Liu, Jinhua; Wu, Jingang; Wong, Waisum; Yu, Shaofeng; Wu, Hanming; Lee, Shiuh-Wuu; Wang, Yangyuan; Huang, Ru
收藏  |  浏览/下载：5/0  |  提交时间：2017/12/03
On the origin of frequency dependence of single-trap induced degradation in AC NBTI 其他
2015-01-01
Mao, Dongyuan; Guo, Shaofeng; Wang, Runsheng; Liu, Changze; Huang, Ru
收藏  |  浏览/下载：2/0  |  提交时间：2017/12/03
Understanding NBTI-induced dynamic variability in the nano-reliability Era: From devices to circuits 其他
2015-01-01
Wang, Runsheng; Ren, Pengpeng; Liu, Changze; Guo, Shaofeng; Huang, Ru
收藏  |  浏览/下载：2/0  |  提交时间：2017/12/03
Understanding NBTI-induced Dynamic Variability in the nano-Reliability Era: from Devices to Circuits 其他
2015-01-01
Wang, Runsheng; Ren, Pengpeng; Liu, Changze; Guo, Shaofeng; Huang, Ru
收藏  |  浏览/下载：2/0  |  提交时间：2017/12/03
On the Origin of Frequency Dependence of Single-Trap Induced Degradation in AC NBTI 其他
2015-01-01
Mao, Dongyuan; Guo, Shaofeng; Wang, Runsheng; Liu, Changze; Huang, Ru
收藏  |  浏览/下载：2/0  |  提交时间：2017/12/03
Impact of heavy ion irradiation on CMOS current mirrors based on SOI and bulk Si substrates: mismatch and output impedance 其他
2015-01-01
Wu, Weikang; An, Xia; Tan, Fei; Chen, Yehua; Liu, Jingjing; Zhang, Yao; Zhang, Xing; Shen, Dongjun; Guo, Gang; Huang, Ru
收藏  |  浏览/下载：4/0  |  提交时间：2017/12/04
New Observations on Complex RTN in Scaled High-kappa/Metal-gate MOSFETs - the Role of Defect Coupling under DC/AC Condition 其他
2013-01-01
Ren, Pengpeng; Hao, Peng; Liu, Changze; Wang, Runsheng; Jiang, Xiaobo; Qin, Yingxin; Huang, Ru; Guo, Shaofeng; Luo, Mulong; Zou, Jibin; Li, Meng; Wang, Jianping; Wu, Jingang; Liu, Jinhua; Bu, Weihai; Wong, Waisum; Yu, Scott; Wu, Hanming; Lee, Shiuh-Wuu; Wang, Yangyuan
收藏  |  浏览/下载：3/0  |  提交时间：2015/11/13
A Unified Approach for Trap-Aware Device/Circuit Co-Design in Nanoscale CMOS Technology 其他
2013-01-01
Wang, Runsheng; Luo, Mulong; Guo, Shaofeng; Huang, Ru; Liu, Changze; Zou, Jibin; Wang, Jianping; Wu, Jingang; Xu, Nuo; Wong, Waisum; Yu, Scott; Wu, Hanming; Lee, Shiuh-Wuu; Wang, Yangyuan
收藏  |  浏览/下载：2/0  |  提交时间：2015/11/13
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