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FOI FinFET with Ultra-low Parasitic Resistance Enabled by Fully Metallic Source and Drain Formation on Isolated Bulk-Fin 会议论文
作者:  Wu ZH(吴振华);  Luo J(罗军);  Meng LK(孟令款)
收藏  |  浏览/下载:32/0  |  提交时间:2017/05/19
Model Order Hypothetical Verification of Discrete Preisach Plane: Theory and Atomic Force Microscope Experiment Results 会议论文
2010 8th World Congress on Intelligent Control and Automation (WCICA 2010), Jinan, China, July 7-9, 2010
作者:  Miao L(缪磊);  Zhang WL(张纹霖);  Pei LL(裴立力);  Jiang ZM(江泽民);  Du YK(杜英魁)
收藏  |  浏览/下载:15/0  |  提交时间:2012/06/06


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