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长春光学精密机械与物... [2]
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会议论文 [2]
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2010 [1]
2006 [1]
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内容类型:会议论文
专题:长春光学精密机械与物理研究所
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Measuring instrument for radial composite deviations of high-precision master gear (EI CONFERENCE)
会议论文
6th International Symposium on Precision Engineering Measurements and Instrumentation, August 8, 2010 - August 11, 2010, Hangzhou, China
Ma Y.
;
Wang T.
;
Lou Z.
;
Wang L.
;
Zhang Y.
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  |  
浏览/下载:27/0
  |  
提交时间:2013/03/25
During double flank rolling composite detection
the radial composite deviations of master gears has been existed and transferred to the measured gear by the primary harmonic curve. In order to improve measurement accuracy
a measuring instrument is developed for radial composite deviations of high-precision master gear in the paper. This instrument uses the structure of spring-suspend swing span to overcome the shortcomings of large rotation errors
low sensitivity
low resolution and large measuring force appearing in the traditional combination-type gear inspection instrument. Artificial intelligence technology is used to improve the efficiency and accuracy of this instrument. The result is that the measuring apparatus is able to meet the requirement and improve efficiency through the measuring experiments on master gears of precision grade 2 with modulus 2 mm and 3 mm
respectively. 2010 SPIE.
Analysis of a precise instrument for measuring reference level involute (EI CONFERENCE)
会议论文
Third International Symposium on Precision Mechanical Measurements, August 2, 2006 - August 6, 2006, Xinjiang, China
Lou Z.
;
Wang L.
;
Wang X.
;
Ma Y.
;
Zhang Y.
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  |  
浏览/下载:17/0
  |  
提交时间:2013/03/25
Reference level involute is used for evaluating other involutes
but it is very difficult to measure reference level involute exactly. Nowadays the available methods for measuring precise involute include single base disc mode
electronic generation mode
and CNC three-coordinate mode. But measurement accuracy of the modes above is not suitable for reference level involute. A precise instrument for measuring reference level involute
double base discs instrument
is introduced. It is consistent with generation principle of the involute entirely. Besides having the advantages of single basic disc instrument
the instrument can remove Abbe error caused by the stylus
and has no pressure deforming. The instrument's structure is described. The main sources of measurement errors are analyzed and methods for compensation are presented. Finally
uncertainty of the instrument is given
which meets reference level involute test specification.
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