QQ客服 官方微博 反馈留言

浏览/检索结果: 共7条，第1-7条 帮助 限定条件 内容类型：会议论文    专题：长春光学精密机械与物理研究所    第一署名单位    第一作者单位    通讯作者单位     已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 Non-null annular subaperture stitching interferometry for aspheric test 会议论文 Optifab 2015, NY, 2015 - October 15 作者:  Zhang, Lei;  Liu, Dong;  Shi, Tu;  Yang, Yongying;  Chong, Shiyao 收藏  |  浏览/下载：34/0  |  提交时间：2016/07/18 Model-based phase-shifting interferometer 会议论文 Optifab 2015, NY, 2015 - October 15 作者:  Liu, Dong;  Zhang, Lei;  Shi, Tu;  Yang, Yongying;  Chong, Shiyao 收藏  |  浏览/下载：22/0  |  提交时间：2016/07/18 Real-time auto-light system for high-speed camera 会议论文 3rd International Conference on Advanced Design and Manufacturing Engineering, ADME 2013, July 13, 2013 - July 14, 2013, Anshan, China Yang H.; Liang M. H. 收藏  |  浏览/下载：12/0  |  提交时间：2014/05/15 ZnO films growth at different temperature on the substrate of Corning glass by MOCVD (EI CONFERENCE) 会议论文 2009 International Symposium on Liquid Crystal Science and Technology, August 2, 2009 - August 5, 2009, Kunming, China Tang W.; Yang X.; Wang C.; Zhao C.; Gao X.; Yang J.; Liu B.; Liang H.; Zhao J.; Sun J.; Du G. 收藏  |  浏览/下载：17/0  |  提交时间：2013/03/25 We deposited ZnO films on Corning glass substrate by metal-organic chemical vapor deposition (MOCVD). We found the diffraction (002) peak at ~34.46  indicating that the ZnO thin films were C-oriented. ZnO films were highly transparent with a transmission ratio larger than 85% in the visible range. The surface morphology of the films was observed by atomic force microscopy (AFM). (2010) Trans Tech Publications.   Growth of ZnO films under different oxygen partial pressures by metal organic chemical vapour deposition (EI CONFERENCE) 会议论文 2009 International Symposium on Liquid Crystal Science and Technology, August 2, 2009 - August 5, 2009, Kunming, China Wang C.; Yang X.; Liu B.; Zhao C.; Tang W.; Yang J.; Gao X.; Liang H.; Zhao J.; Sun J.; Du G. 收藏  |  浏览/下载：19/0  |  提交时间：2013/03/25 ZnO films were grown under different oxygen partial pressures by metal organic chemical vapor deposition on the substrates of Corning glass. We investigated the quality of the films by SIEMENS D8 X-ray diffractometer. The surface morphology of the films were observed by Digital Nanoscope IIIa AFM with normal silicon nitride tip in the contact mode. The hall effect measurements were carried out with indium ohmic contact. The transmission spectrum of the films were measured. The transmission ratio is larger than 80% in the region above the wavelength of 385nm  and sharply decreased under 10% below the wavelength of 375 nm. (2010) Trans Tech Publications.   Auto-detection system of photoelectric encoder based on DSP (EI CONFERENCE) 会议论文 2010 2nd International Conference on Industrial and Information Systems, IIS 2010, July 10, 2010 - July 11, 2010, Dalian, China Wan Q.-H.; Yang W.; Zhao C.-H.; Du Y.-C.; Lu X.-R.; Liang L.-H.; Qi L.-L. 收藏  |  浏览/下载：15/0  |  提交时间：2013/03/25 To improve the automatic detection efficiency of photoelectric encoder  an auto-detection system of photoelectric encoder is designed using DSP (TMS320F2812) as the core device. A 21-bit high accuracy photoelectric encoder is used as the angle standard. It is connected to the detected photoelectric encoder coaxially. They will rotate synchronously under the driving of electric motor. Data acquisition and processing system collects the angular data of the two photoelectric encoders at the same angular position and calculates the angular error of detected photoelectric encoder. Then the data is put into computer. The computer will display the data error. The result of experiment shows that the system could detect encoder whose bit-number below 19  the detecting person could be reduced to one and the detecting speed could be increased to 8-10 times. 2010 IEEE.   Resolution performance of extreme ultraviolet telescope (EI CONFERENCE) 会议论文 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, November 19, 2008 - November 21, 2008, Chengdu, China Gao L.; Yang L.; Li D.-S.; Ni Q.-L.; Liang J.-Q.; Chen B. 收藏  |  浏览/下载：20/0  |  提交时间：2013/03/25 Extreme Ultraviolet Telescope (EUT) will image solar corona in four EUV narrow bandpasses defined by multilayered coatings deposited on normal incidence optics. In order to make sure it will get sub-arcsecond angular resolution in the mission we have to test its resolution performance on ground. The EUT is aligned by Zygo interferometer first and a global wavefront error of 0.152 peak to valley is obtained ( = 632.8nm ). Because of the difficulty of angular resolution test for EUT at its operating wavelengths  we test its optical performance at visible and UV band. The method is to place the resolution test-target on the focal plane of collimator and illuminate the target by visible and UV light espectively  then the collimated light will go through EUT and image at focal plane on CCD. By analysis of the images obtained in experiments we conclude that the angular resolution of EUT is 1.22 at visible light ( = 570nm ) which is very close to diffraction limit (1.20) and according to these results we estimate that the operational wavelength resolution is better than 0.32  meets design requirements. While for UV light  the angular resolution is 1.53 that is different from diffraction limit (0.53)  the error comes mainly from large pixel of EUV camera. 2009 SPIE.