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| Chip on carrier 专利
专利号: US10374386, 申请日期: 2019-08-06, 公开日期: 2019-08-06
作者: MU, JIANWEI; DING, FRANK LEI; WU, TAO; DENG, HONGYU; AMIRKIAI, MAZIAR
  收藏 | 浏览/下载：45/0 | 提交时间：2019/12/23 |
| Ag/Co(OH) nano array thin film super capacitor electrode material and preparation method thereof 专利
申请日期: 2016-01-01,
作者: DING LIJUN; WU MINGZAI; LIU TAO
收藏 | 浏览/下载：4/0 | 提交时间：2019/04/19 |
| Dot and box chess game system based on UCT algorithm 专利
申请日期: 2016-01-01,
作者: WU LEI; ZHANG HAO; DING RUIMIAO; WANG WENTAO; LIU YANG
收藏 | 浏览/下载：6/0 | 提交时间：2019/04/19 |
| Direct current cascade arc plasma tokamak torch mirror cleaning device, has gas supply unit fixed with cascade source, vacuum unit connected with vacuum chamber, and quartz window fixed with optical fiber that is fixed with spectrograph. 专利
申请日期: 2015-01-01, 公开日期: 2015-07-15
作者: CHEN J DING H LI C WANG Y WANG Z WU
收藏 | 浏览/下载：2/0 | 提交时间：2019/12/09 |
| Liquid sample laser-induced breakdown spectrum detecting device, has plasma discharge circuit emitting light signal as electric signal to obtain spectrum data, and data analyzing unit connected with signal receiving unit to obtain data. 专利
申请日期: 2015-01-01, 公开日期: 2015-04-08
作者: DING H FENG C HAI R LIU P WU D SUN
收藏 | 浏览/下载：4/0 | 提交时间：2019/12/09 |
| Macroscopic three-dimensional network carbon nanotubes, where in macroscopic body is made of carbon nanotubes and three-dimensional network body is made of sheet layers. 专利
申请日期: 2015-01-01, 公开日期: 2015-08-26
作者: LI X WU Z YAN J WU T DING Z
收藏 | 浏览/下载：7/0 | 提交时间：2019/12/09 |
| On-line thin film chemical metering ratio and component weight ratio test device for pulsed laser deposition film, has computer connected with optical fiber spectrometer, quartz crystal thickness monitor and pulse laser. 专利
申请日期: 2013-01-01, 公开日期: 2013-07-10
作者: WU X DING H LI C ZHANG C
收藏 | 浏览/下载：2/0 | 提交时间：2019/12/13 |
| Wall material ablation characteristic measuring device, has quartz crystal microbalance thickness monitor connected with computer, and vacuum system provided with vacuum chamber and vacuum pump group. 专利
申请日期: 2013-01-01, 公开日期: 2013-07-10
作者: WU X DING H LI C ZHANG C
收藏 | 浏览/下载：5/0 | 提交时间：2019/12/13 |
| Method for measuring ablation resistance characteristic of materials, involves calculating natural resonant frequency of quartz crystal by considering specific formula. 专利
申请日期: 2013-01-01, 公开日期: 2013-06-12
作者: WU X DING H LI C ZHANG C
收藏 | 浏览/下载：8/0 | 提交时间：2019/12/13 |
| On-line PLD thin film chemical metering ratio and quality measuring method, involves arranging plating film with target part, placing substrate on rotating substrate table, and finishing spectral line intensity calculating operation. 专利
申请日期: 2013-01-01, 公开日期: 2013-07-10
作者: WU X DING H LI C ZHANG C
收藏 | 浏览/下载：2/0 | 提交时间：2019/12/13 |
