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Correlation between the Decoupling Capacitor Layouts and Single-Event-Upset Resistances of SRAM cells 会议论文
作者:  Zhentao Li;  Zheng ZS(郑中山);  Zhao K(赵凯);  Li B(李博);  Luo JJ(罗家俊)
收藏  |  浏览/下载:22/0  |  提交时间:2019/05/13
Back gate impact on SEU Characterization of a Double SOI 4k-bit SRAM 会议论文
作者:  Gao JT(高见头);  Li BH(李彬鸿);  Huang Y(黄杨);  Li B(李博);  Zhao FZ(赵发展)
收藏  |  浏览/下载:47/0  |  提交时间:2019/05/09
The impact of TID effect on EMS of PDSOI voltage reference circuits 会议论文
作者:  An ZH(安志航);  Li BH(李彬鸿);  Li B(李博);  Zhao WX(赵文欣);  Luo JJ(罗家俊)
收藏  |  浏览/下载:12/0  |  提交时间:2019/05/10
Research on Parent-child Behavior in Waiting Area of Hospital Based on Monitoring Data(Ⅱ)—Analysis on the Activity Region and Behavioral Pattern 会议论文
Proceedings of the 13th International Symposium for Environment-Behavior Studies
作者:  Liu YJ(刘瑶佳);  Gu ZC(顾宗超);  Lu W(陆伟);  Wu L(吴亮);  Zhao JJ(赵敬敬)
收藏  |  浏览/下载:11/0  |  提交时间:2019/12/02


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