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Optimization of WEDM process parameters for monocrystalline silicon by response surface method and genetic algorithm 会议论文
2017 International Conference on Artificial Intelligence, Automation and Control Technologies, AIACT 2017, Wuhan, China, 2017-04-07
作者:  Chen, Yu-Long;  Li, Shu-Juan;  Huang, Hu;  Gu, Zhong-Hao
收藏  |  浏览/下载:3/0  |  提交时间:2019/12/20


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