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Reconstruction of GaAs/AlAs supperlattice multilayer structure by quantification of AES and SIMS sputter depth profiles 期刊论文
applied surface science, 2016, 卷号: 388, 页码: 584-588
H.L. Kang; J.B. Lao; Z.P. Li; W.Q. Yao; C. Liu; J.Y. Wang
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