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Note: Measuring effects of Ar-ion cleaning on the secondary electron yield of copper due to electron impact 期刊论文
REVIEW OF SCIENTIFIC INSTRUMENTS, 2012, 卷号: 83, 期号: [db:dc_citation_issue]
作者:  Zhang, Hai-Bo;  Hu, Xiao-Chuan;  Wang, Rui;  Cao, Meng;  Zhang, Na
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