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TDDB characteristics of ultra-thin HfN/HfO2 gate stack 其他
2004-01-01
Yang, Hong; Sa, Ning; Tang, Liang; Liu, Xiaoyan; Kang, Jinfeng; Han, Ruqi; Yu, H.Y.; Ren, C.; Li, M.-F.; Chan, D.S.H.; Kwong, D.-L.
收藏  |  浏览/下载:3/0  |  提交时间:2015/11/13
Characteristics of sub-1 nm CVD HfO2 gate dielectrics with HfN electrodes for advanced CMOS applications 其他
2004-01-01
Kang, J.F.; Yu, H.Y.; Ren, C.; Wang, X.P.; Li, M.-F.; Chan, D.S.H.; Liu, X.Y.; Han, R.Q.; Wang, Y.Y.; Kwong, D.-L.
收藏  |  浏览/下载:4/0  |  提交时间:2015/11/13


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