CORC

浏览/检索结果: 共2条,第1-2条 帮助

限定条件                
已选(0)清除 条数/页:   排序方式:
Dual-bottom-electrode CMUT based on standard CMOS process 会议论文
6th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2011, Kaohsiung, Taiwan
作者:  Ting Yu;  Xingqiang Lu;  Fengqi Yu
收藏  |  浏览/下载:9/0  |  提交时间:2015/08/25
Investigation of Thermal Stress Influence on CMUT in Standard CMOS Process 会议论文
2009 IEEE International Conference on Information and Automation, ICIA 2009
作者:  Xingqiang Lu;  Ting Yu;  Fengqi Yu;  Yuchun Feng
收藏  |  浏览/下载:7/0  |  提交时间:2015/08/21


©版权所有 ©2017 CSpace - Powered by CSpace