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Study of strained-silicon channel metal-oxide-semiconductor field effect transistors by large angle convergent-beam electron diffraction 期刊论文
ULTRAMICROSCOPY, 2008, 卷号: 108, 期号: 9, 页码: 816
Liu, HH; Duan, XF; Xu, QX; Liu, BG
收藏  |  浏览/下载:15/0  |  提交时间:2013/09/24
Nanoscale strain analysis of strained-Si metal-oxide-semiconductor field effect transistors by large angle convergent-beam electron diffraction 期刊论文
APPLIED PHYSICS LETTERS, 2006, 卷号: 88, 期号: 26
Liu, HH; Duan, XF; Qi, XY; Xu, QX; Li, HO; Qian, H
收藏  |  浏览/下载:9/0  |  提交时间:2013/09/24


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