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Vertical interface induced dielectric relaxation in nanocomposite (batio3)(1-x):(sm2o3)(x) thin films 期刊论文
Scientific reports, 2015, 卷号: 5, 页码: 8
作者:  Li, Weiwei;  Zhang, Wei;  Wang, Le;  Gu, Junxing;  Chen, Aiping
收藏  |  浏览/下载:41/0  |  提交时间:2019/05/09
Evaluation of stacking faults and associated partial dislocations in AlSb/GaAs (001) interface by aberration-corrected high-resolution transmission electron microscopy 期刊论文
AIP ADVANCES, 2014, 卷号: 4, 期号: 11
Wen, C; Ge, BH; Cui, YX; Li, FH; Zhu, J; Yu, R; Cheng, ZY
收藏  |  浏览/下载:18/0  |  提交时间:2015/04/14
Strain relaxation and Sn segregation in GeSn epilayers under thermal treatment 期刊论文
APPLIED PHYSICS LETTERS, 2013, 卷号: 102, 期号: 25
Li, H; Cui, YX; Wu, KY; Tseng, WK; Cheng, HH; Chen, H
收藏  |  浏览/下载:10/0  |  提交时间:2014/01/17
Dislocation Behavior in AlGaN/GaN Multiple Quantum-Well Films Grown with Different Interlayers 期刊论文
CHINESE PHYSICS LETTERS, 2012, 卷号: 29, 期号: 9
Sun, HH; Guo, FY; Li, DY; Wang, L; Zhao, DG; Zhao, LC
收藏  |  浏览/下载:20/0  |  提交时间:2013/09/17
Nature of interfacial defects and their roles in strain relaxation at highly lattice mismatched 3C-SiC/Si (001) interface 期刊论文
JOURNAL OF APPLIED PHYSICS, 2009, 卷号: 106, 期号: 7
Wen, C; Wang, YM; Wan, W; Li, FH; Liang, JW; Zou, J
收藏  |  浏览/下载:28/0  |  提交时间:2013/09/24
Epitaxial growth of CaO films on MgO(001) surface: Strain relaxation at the CaO/MgO heterointerface 期刊论文
JOURNAL OF APPLIED PHYSICS, 2007, 卷号: 102, 期号: 4
Li, HD; Zhang, XN; Zhang, Z; Mei, ZX; Du, XL; Xue, QK
收藏  |  浏览/下载:9/0  |  提交时间:2013/09/17
Effect of misfit dislocation originated from strained layer on photoluminescence properties of InxGa1-xN/GaN multiple quantum wells 期刊论文
CHINESE PHYSICS LETTERS, 2005, 卷号: 22, 期号: 4, 页码: 971
Lu, W; Li, DB; Li, CR; Chen, G; Zhang, Z
收藏  |  浏览/下载:15/0  |  提交时间:2013/09/17
Generation and behavior of pure-edge threading misfit dislocations in InxGa1-xN/GaN multiple quantum wells 期刊论文
JOURNAL OF APPLIED PHYSICS, 2004, 卷号: 96, 期号: 9, 页码: 5267
Lu, W; Li, DB; Li, CR; Zhang, Z
收藏  |  浏览/下载:16/0  |  提交时间:2013/09/17
Crosshatching on a SiGe film grown on a Si(001) substrate studied by Raman mapping and atomic force microscopy 期刊论文
PHYSICAL REVIEW B, 2002, 卷号: 65, 期号: 23
Chen, H; Li, YK; Peng, CS; Liu, HF; Liu, YL; Huang, Q; Zhou, JM; Xue, QK
收藏  |  浏览/下载:87/0  |  提交时间:2013/09/17
Thickness and oxygen pressure dependent structural characteristics of BaTiO3 thin films grown by laser molecular beam epitaxy 期刊论文
JOURNAL OF APPLIED PHYSICS, 2000, 卷号: 87, 期号: 10, 页码: 7442
Zhao, T; Chen, F; Lu, HB; Yang, GZ; Chen, ZH
收藏  |  浏览/下载:13/0  |  提交时间:2013/09/23


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