CORC

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Evaluation of stacking faults and associated partial dislocations in AlSb/GaAs (001) interface by aberration-corrected high-resolution transmission electron microscopy 期刊论文
AIP ADVANCES, 2014, 卷号: 4, 期号: 11
Wen, C; Ge, BH; Cui, YX; Li, FH; Zhu, J; Yu, R; Cheng, ZY
收藏  |  浏览/下载:19/0  |  提交时间:2015/04/14
Determining polarity and dislocation core structures at atomic level for epitaxial AlN/(0001)6H-SiC from a single image in HRTEM 期刊论文
ULTRAMICROSCOPY, 2013, 卷号: 126, 页码: 77
Cui, YX; Wang, YM; Wen, C; Ge, BH; Li, FH; Chen, Y; Chen, H
收藏  |  浏览/下载:24/0  |  提交时间:2014/01/16
Influences of dislocation distribution on the resistive switching effect of Ag-SiO2 thin films 期刊论文
ACTA PHYSICA SINICA, 2012, 卷号: 61, 期号: 10
Zhang, PJ; Meng, Y; Liu, ZY; Pan, XY; Liang, XJ; Chen, DM; Zhao, HW
收藏  |  浏览/下载:16/0  |  提交时间:2013/09/18
Interface-confined mixing and buried partial dislocations for Ag bilayer on Pt(111) 期刊论文
PHYSICAL REVIEW B, 2012, 卷号: 86, 期号: 8
Ait-Mansour, K; Brune, H; Passerone, D; Schmid, M; Xiao, WD; Ruffieux, P; Buchsbaum, A; Varga, P; Fasel, R; Groning, O
收藏  |  浏览/下载:17/0  |  提交时间:2013/09/18
Hidden order in the fracture surface morphology of metallic glasses 期刊论文
ACTA MATERIALIA, 2012, 卷号: 60, 期号: 20, 页码: 6952
Gao, M; Sun, BA; Yuan, CC; Ma, J; Wang, WH
收藏  |  浏览/下载:23/0  |  提交时间:2013/09/17
Developing image-contrast theory and analysis methods in high-resolution electron microscopy 期刊论文
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 2010, 卷号: 207, 期号: 12, 页码: 2639
Li, FH
收藏  |  浏览/下载:26/0  |  提交时间:2013/09/17
High-resolution electron microscopy of misfit dislocations in AlSb/GaAs (001) system 期刊论文
ACTA PHYSICA SINICA, 2010, 卷号: 59, 期号: 3, 页码: 1928
Wen, C; Li, FH; Zou, J; Chen, H
收藏  |  浏览/下载:22/0  |  提交时间:2013/09/17
Nature of interfacial defects and their roles in strain relaxation at highly lattice mismatched 3C-SiC/Si (001) interface 期刊论文
JOURNAL OF APPLIED PHYSICS, 2009, 卷号: 106, 期号: 7
Wen, C; Wang, YM; Wan, W; Li, FH; Liang, JW; Zou, J
收藏  |  浏览/下载:28/0  |  提交时间:2013/09/24
Recent Progress in GaN-Based Light-Emitting Diodes 期刊论文
ADVANCED MATERIALS, 2009, 卷号: 21, 期号: 45, 页码: 4641
Jia, HQ; Guo, LW; Wang, WX; Chen, H
收藏  |  浏览/下载:12/0  |  提交时间:2013/09/24
Image Deconvolution-An Effective Tool of Crystal Structure and Defect Determination in High-Resolution Electron Microscopy 期刊论文
ELECTRON CRYSTALLOGRAPHY FOR MATERIALS RESEARCH AND QUANTITATIVE CHARACTERIZATION OF NANOSTRUCTURED MATERIALS, 2009, 卷号: 1184, 页码: 61
Li, FH; Tang, CY
收藏  |  浏览/下载:22/0  |  提交时间:2013/09/17


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