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Characteristics of Gate Current Random Telegraph Signal Noise in SiON/HfO2/TaN p-Type Metal-Oxide-Semiconductor Field-Effect Transistors under Negative Bias Temperature Instability Stress Condition 其他
2010-01-01
Zhang, Liangliang; Liu, Changze; Wang, Runsheng; Huang, Ru; Yu, Tao; Zhuge, Jing; Kirsch, Paul; Tseng, Hsing-Huang; Wang, Yangyuan
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