CORC

浏览/检索结果: 共16条,第1-10条 帮助

限定条件    
已选(0)清除 条数/页:   排序方式:
Trade-offs between stress control and blister avoidance in MEMS devices 其他
2019-01-01
作者:  Sun, Quansheng;  Wu, Lixiang;  Wang, Junli;  Wang, Gaofeng
收藏  |  浏览/下载:14/0  |  提交时间:2019/12/05
Low-frequency Testing of Through Silicon Vias for Defect Diagnosis in Three-dimensional Integration Circuit Stacking Technology 其他
2014-01-01
Xu, Yichao; Miao, Min; Fang, Runiu; Sun, Xin; Zhu, Yunhui; Sun, Minggang; Wang, Guanjiang; Jin, Yufeng
收藏  |  浏览/下载:5/0  |  提交时间:2017/12/03
Defects and electrical properties of crystalline silicon at different metallurgical route 其他
2013-01-01
Lai, Hui Xian; Huang, Liu Qing; Fang, Ming; Lu, Cheng Hao; Chen, Juan; Yu, De Qin; Li, Jin Tang; Ma, Wen Hui; Shen, Jian Ning; Sheng, Zhi Lin; Luo, Xue Tao; 罗学涛
收藏  |  浏览/下载:3/0  |  提交时间:2015/07/22
Material engineering technique for SiOX-based embedded RRAM with CMOS compatible process 其他
2012-01-01
Pan, Yue; Huang, Ru; Huang, Yinglong; Zhang, Lijie; Tan, Shenghu; Cai, Yimao; Wang, Yangyuan
收藏  |  浏览/下载:3/0  |  提交时间:2015/11/13
Impacts of Non-negligible Electron Trapping/Detrapping on the NBTI Characteristics in Silicon Nanowire Transistors with TiN Metal Gates 其他
2008-01-01
Zhang, Liangliang; Wang, Runsheng; Zhuge, Jing; Huang, Ru; Kim, Dong-Won; Park, Donggun; Wang, Yangyuan
收藏  |  浏览/下载:2/0  |  提交时间:2015/11/10
Characteristics of As-grown hole trapping in silicon oxynitride p-MOSFETs subjected to negative bias temperature stress 其他
2008-01-01
Wang, Yangang; Zhang, J.F.; Chang, M.H.; Xu, Mingzhen; Tan, Changhua
收藏  |  浏览/下载:3/0  |  提交时间:2015/11/12
The impact of forming temperature on material and electrical characteristics of nickel silicide gate electrode 其他
2007-01-01
Shan, Xiaonan; Cai, Yimao; Xu, Chuan; Li, Yan; Huang, Ru
收藏  |  浏览/下载:3/0  |  提交时间:2015/11/10
Physical model for surface annihilation of silicon interstitials during annealing 其他
2006-01-01
Zhang, Xiao; Yu, Min; Zhan, Kai; Ren, Liming; Huang, Ru; Zhang, Xing; Wang, Yangyuan
收藏  |  浏览/下载:4/0  |  提交时间:2015/11/13
The role of surface annihilation in annealing investigated by atomic model simulation 其他
2005-01-01
Yu, M; Zhang, X; Huang, R; Zhang, X; Wang, YY; Zhang, JY; Oka, H
收藏  |  浏览/下载:5/0  |  提交时间:2015/11/13
The role of surface annihilation in annealing investigated by atomic model simulation 其他
2005-01-01
Yu, Min; Zhang, Xiao; Huang, Ru; Zhang, Xing; Wang, Yangyuan; Zhang, Jinyu; Oka, Hideki
收藏  |  浏览/下载:1/0  |  提交时间:2015/11/13


©版权所有 ©2017 CSpace - Powered by CSpace