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Understanding charge traps for optimizing Si-passivated Ge nMOSFETs 其他
2016-01-01
Ren, P.; Gao, R.; Ji, Z.; Arimura, H.; Zhang, J. F.; Wang, R.; Duan, M.; Zhang, W.; Franco, J.; Sioncke, S.; Cott, D.; Mitard, J.; Witters, L.; Mertens, H.; Kaczer, B.; Mocuta, A.; Collaert, N.; Linten, D.; Huang, R.; Thean, A. V.Y.; Groeseneken, G.
收藏  |  浏览/下载:4/0  |  提交时间:2017/12/03
Theoretical Investigation on Hydrogen-related Oxide Traps in HfO_2 Gate Dielectrics: An ab-initio Study 其他
2016-01-01
Yawen Zhang; Peng Hao; Runsheng Wang; Jingwei Ji; Ru Huang
收藏  |  浏览/下载:6/0  |  提交时间:2017/12/03
Time dependent 3-D statistical KMC simulation of high-k degradation including trap generation and electron capture/emission dynamic 其他
2014-01-01
Wang, Yijiao; Huang, Peng; Liu, Xiaoyan; Du, Gang; Kang, Jinfeng
收藏  |  浏览/下载:4/0  |  提交时间:2017/12/03
Contribution of as-grown hole traps to NBTI 其他
2007-01-01
Chang, M.H.; Wang, Y.; Zhang, J.F.; Zhao, C.Z.; Zhang, W.D.; Xu, M.
收藏  |  浏览/下载:5/0  |  提交时间:2015/11/13
Charactcristics of sub-1 nm CVID HfO2 gate dielectrics with HfN electrodcs for advanccd CMOS applications 其他
2004-01-01
Kang, JF; Yu, HY; Ren, C; Wang, XP; Li, MF; Chan, DSH; Liu, XY; Han, RQ; Wang, YY; Kwong, DL
收藏  |  浏览/下载:2/0  |  提交时间:2015/11/13
A new observation of hot-carrier induced interface traps spatial distribution in 0.135 mu m n-MOSFET by gate-diode 其他
2004-01-01
Zhao, Y; Xu, MZ; Tan, CH
收藏  |  浏览/下载:3/0  |  提交时间:2015/11/13
Characteristics of sub-1 nm CVD HfO2 gate dielectrics with HfN electrodes for advanced CMOS applications 其他
2004-01-01
Kang, J.F.; Yu, H.Y.; Ren, C.; Wang, X.P.; Li, M.-F.; Chan, D.S.H.; Liu, X.Y.; Han, R.Q.; Wang, Y.Y.; Kwong, D.-L.
收藏  |  浏览/下载:4/0  |  提交时间:2015/11/13
A statistic model for ion clouds in Paul traps 其他
2000-01-01
Hou, JD; Wang, YQ; Yang, DH
收藏  |  浏览/下载:3/0  |  提交时间:2015/11/13


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