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Two-Dimensional Self-Consistent Simulation on Program/Retention Operation of Charge Trapping Memory 其他
2014-01-01
Lun, Zhiyuan; Liu, Shuhuan; Zhao, Kai; Du, Gang; Wang, Yi; Liu, Xiaoyan
收藏  |  浏览/下载:6/0  |  提交时间:2015/11/13
Characteristics of Gate Current Random Telegraph Signal Noise in SiON/HfO2/TaN p-Type Metal-Oxide-Semiconductor Field-Effect Transistors under Negative Bias Temperature Instability Stress Condition 其他
2010-01-01
Zhang, Liangliang; Liu, Changze; Wang, Runsheng; Huang, Ru; Yu, Tao; Zhuge, Jing; Kirsch, Paul; Tseng, Hsing-Huang; Wang, Yangyuan
收藏  |  浏览/下载:2/0  |  提交时间:2015/11/13
Impacts of Non-negligible Electron Trapping/Detrapping on the NBTI Characteristics in Silicon Nanowire Transistors with TiN Metal Gates 其他
2008-01-01
Zhang, Liangliang; Wang, Runsheng; Zhuge, Jing; Huang, Ru; Kim, Dong-Won; Park, Donggun; Wang, Yangyuan
收藏  |  浏览/下载:2/0  |  提交时间:2015/11/10
VDNROM: A novel four-bits-per-cell vertical channel dual-nitride-trapping- layer ROM for high density flash memory applications 其他
2007-01-01
Zhou, Falong; Cai, Yimao; Huang, Ru; Li, Yan; Shan, Xiaonan; Liu, Jia; Guo, Ao; Zhang, Xing; Wang, Yangyuan
收藏  |  浏览/下载:2/0  |  提交时间:2015/11/10
VDNROM: A novel four-physical-bits/cell vertical channel dual-nitride-trapping-layers ROM for high density flash memory applications 其他
2007-01-01
Zhou, Falong; Cai, Ylinao; Huang, Ru; Li, Yan; Shan, Xiaonan; Liu, Jla; Guo, Ao; Zhang, Xing; Wang, Yangyuan
收藏  |  浏览/下载:2/0  |  提交时间:2015/11/12
VDNROM: A novel four-bits-per-cell vertical channel dual-nitride-trapping-layer ROM for high density flash memory applications 其他
2006-01-01
Zhou, Falong; Cai, Yimao; Huang, Ru; Li, Yan; Shan, Xiaonan; Liu, Jia; Guo, Ao; Zhang, Xing; Wang, Yangyuan
收藏  |  浏览/下载:3/0  |  提交时间:2015/11/13


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