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Interfacial diffusion aided deformation during nanoindentation 其他
2016-01-01
Samanta, Amit; Weinan, E.
收藏  |  浏览/下载：118/0  |  提交时间：2017/12/04
Reliability investigation of high-k/metal gate in nMOSFETs by three-dimensional kinetic Monte-Carlo simulation with multiple trap interactions 其他
2016-01-01
Li, Yun; Jiang, Hai; Lun, Zhiyuan; Wang, Yijiao; Huang, Peng; Hao, Hao; Du, Gang; Zhang, Xing; Liu, Xiaoyan
收藏  |  浏览/下载：4/0  |  提交时间：2017/12/03
Fabrication and Traceable Quality Evaluation of Fine Pitch TSV with Self-integrated Micro Heater and Thermocouple 其他
2016-01-01
Guan, Yong; Zeng, Qinghua; Bian, Yuan; Zhong, Xiao; Chen, Jing; Ma, Shenglin; Zhu, Yunhui; Jin, Yufeng
收藏  |  浏览/下载：7/0  |  提交时间：2017/12/03
Evaulation the Degradation in nMOSFETs with HfO2 Gate Dielectric and Interfacial Layer by 3D Kinetic Monte-Carlo Method 其他
2016-01-01
Li, Yun; Lun, Zhiyuan; Wang, Yijiao; Huang, Peng; Jiang, Hai; Zhang, Xing; Du, Gang; Liu, Xiaoyan
收藏  |  浏览/下载：2/0  |  提交时间：2017/12/03
Insight into PBTI in InGaAs Nanowire FETs with Al2O3 and LaAlO3 Gate Dielectrics 其他
2016-01-01
Li, Y.; Di, S. Y.; Jiang, H.; Huang, P.; Wang, Y. J.; Lun, Z. Y.; Shen, L.; Yin, L. X.; Zhang, X.; Du, G.; Liu, X. Y.
收藏  |  浏览/下载：5/0  |  提交时间：2017/12/03
Analysis of Self-heating Effect in a SOI LDMOS Device under an ESD Stress 其他
2016-01-01
Tianxing Li; Jian Cao; Lizhong Zhang; Yuan Wang
收藏  |  浏览/下载：4/0  |  提交时间：2017/12/03
High reliability of IGZO TFTs using low-temperature fabricated organic passivation layers 其他
2016-01-01
Huiling Lu; Ting Liang; Shengdong Zhang
收藏  |  浏览/下载：7/0  |  提交时间：2017/12/03
On the Assessment of End-of-Life Variability induced by Stochastic NBTI in Nanoscale MOSFETs Accompanying Conspicuous RTN 其他
2016-01-01
Tao Sun; Runsheng Wang; Pengpeng Ren; Xiaobo Jiang; Ru Huang
收藏  |  浏览/下载：6/0  |  提交时间：2017/12/03
Mechanical and Electrical Reliability Assessment of Bump-less Wafer-on-Wafer Integration with One-time Bottom-up TSV Filling 其他
2015-01-01
Guan, Yong; Zhu, Yunhui; Zeng, Qinghua; Ma, Shenglin; Su, Fei; Bian, Yuan; Zhong, Xiao; Chen, Jing; Jin, Yufeng
收藏  |  浏览/下载：3/0  |  提交时间：2017/12/03
Duty Cycle Shift under Static/Dynamic Aging in 28nm HK-MG Technology 其他
2015-01-01
Sutaria, Ketul B.; Ren, Pengpeng; Mohanty, Abinash; Feng, Xixiang; Wang, Runsheng; Huang, Ru; Cao, Yu
收藏  |  浏览/下载：7/0  |  提交时间：2017/12/03

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