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CORC

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High temperature behavior of multi-region direct current current-voltage spectroscopy and relationship with shallow-trench-isolation-based high-voltage laterally diffused metal-oxide-semiconductor field-effect-transistors reliability 其他
2014-01-01
He, Yandong; Zhang, Ganggang; Zhang, Xing
收藏  |  浏览/下载：5/0  |  提交时间：2017/12/03
Electrode/oxide interface engineering by inserting single-layer graphene: Application for HfOx-based resistive random access memory 其他
2012-01-01
Chen, Hong-Yu; Tian, He; Gao, Bin; Yu, Shimeng; Liang, Jiale; Kang, Jinfeng; Zhang, Yuegang; Ren, Tian-Ling; Wong, H.-S. Philip
收藏  |  浏览/下载：2/0  |  提交时间：2015/11/17
A Multi-region Trap Characterization Method and Its Reliability Application on STI-based High-Voltage LDMOSFETs 其他
2012-01-01
He, Yandong; Zhang, Ganggang; Zhang, Xing
收藏  |  浏览/下载：3/0  |  提交时间：2015/11/13
The Parasitic Effects Induced by the Contact in RRAM with MIM Structure 其他
2008-01-01
Zhang, Lijie; Huang, Ru; Wang, Albert Z. H.; Wu, Dake; Wang, Runsheng; Kuang, Yongbian
收藏  |  浏览/下载：4/0  |  提交时间：2015/11/10
Monte Carlo simulation of band-to-band tunneling in silicon devices 其他
2007-01-01
Xia, Zhiliang; Du, Gang; Song, Yuncheng; Wang, Jian; Liu, Xiaoyan; Kang, Jinfeng; Han, Ruqi
收藏  |  浏览/下载：4/0  |  提交时间：2015/11/13
共沉淀法制备ZrO_2-Al_2O_3纳米复合氧化物的物相表征 其他
2003-01-01
梁健; 黄惠忠; 谢有畅
收藏  |  浏览/下载：3/0  |  提交时间：2015/10/24
Effect of SiO2/Si interface roughness on gate current 其他
2001-01-01
Mao, LF; Yang, Y; Wei, JL; Zhang, HQ; Xu, MZ; Tan, CH
收藏  |  浏览/下载：6/0  |  提交时间：2015/11/10

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