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Super resolution nano-information recording in a new hydrazone metal complex material 会议论文
作者:  Zhang, Kui;  Wei, Jingsong;  Chen, Zhimin;  Wei, Tao;  Geng, Yongyou
收藏  |  浏览/下载：29/0  |  提交时间：2017/12/25
Study of hafina-silica mixed coatings with different compositions prepared by E-beam co-evaporation 会议论文
4th pacific rim laser damage symposium on optical materials for high-power lasers
作者:  Xing, Huanbin;  Zhu, Meiping;  Chai, Yingjie;  Tu, Feifei;  Wang, Hu
收藏  |  浏览/下载：18/0  |  提交时间：2016/11/28
Modification of simplified modal method for subwavelength triangular grating with very high efficiency 会议论文
Progress in Electromagnetics Research Symposium, PIERS 2014, August 25, 2014 - August 28, 2014, Guangzhou, China
Wang B.; Wu Y.; Hao P.; Zhou W.
收藏  |  浏览/下载：10/0  |  提交时间：2015/04/27
Characterization of hafnia thin films made with different deposition technologies 会议论文
Proc. of SPIE, 2011
作者:  Wanjun Ai;  Shengming Xiong
收藏  |  浏览/下载：7/0  |  提交时间：2016/11/25
Dielectric behaviors of ZnFe2O4-SiO2 composite thin films prepared by sol-gel method 会议论文
INTERNATIONAL JOURNAL OF MODERN PHYSICS B, 12th International Symposium on Small Particles and Inorganic Clusters, Nanjing, PEOPLES R CHINA, Web of Science
Jiang, H; Liu, HW; Yu, H; Gao, F; Liu, JM
收藏  |  浏览/下载：3/0
Effects of thickness of the thermal insulation layer on the properties of PbTiO3 thin films 会议论文
作者:  Wu, Xiaoqing;  Yao, Xi;  Ren, Wei;  Shi, Peng;  Zhang, Liangying
收藏  |  浏览/下载：8/0  |  提交时间：2019/12/18
Determination of optical constants of zirconia and silica thin films in UV to visible range (EI CONFERENCE) 会议论文
3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies, AOMATT 2007: Advanced Optical Manufacturing Technologies, July 8, 2007 - July 12, 2007, Chengdu, China
Jin W.; Jin C.; Zhu H.; Liu L.; Yang H.
收藏  |  浏览/下载：12/0  |  提交时间：2013/03/25
A curve fitting method for determining the optical constants of some dielectric thin films is described with dispersion theory in the paper. A computer program based on Matlab is developed and optimized. The fitting errors are analyzed with theoretical data  which gives very high accurate results. A program is applied to fitting the measured photometric spectra of ion sputtered zirconia and silica thin films in 200-850nm spectra range. The thickness is verified with the method of grazing x-ray diffraction. With the thickness known  the optical constants of zirconia films near the absorption range are obtained with single-wavelength method. As a result  quite good fitting results are obtained with high accuracy. Finally  an ultraviolet (UV) high-pass optical filter is designed with optical constants extracted by this method. The transmission and reflection spectra of the filter are measured and compared to designed spectra. A good coherence was derived.  
Determination of optical constants of zirconia and silica thin films in UV to visible range - art. no. 67220T 会议论文
2007
Jin W. H.; Jin C. S.; Zhu H. L.; Liu L.; Yang H. J.
收藏  |  浏览/下载：4/0  |  提交时间：2013/03/28
Silica and alumina thin films grown by liquid phase deposition 会议论文
PRICM 5: The Fifth Pacific Rim International Conference on Advanced Materials and Processing, Beijing, China, 2004-11-02
作者:  Sun, Jie;  Hu, Lizhong;  Wang, Zhaoyang;  Du, Guotong
收藏  |  浏览/下载：4/0  |  提交时间：2020/01/02
Microstructural characterization of low dielectric silica xerogel film 会议论文
International Conference on Materials for Advanced Technologies, Singapore, SINGAPORE, DEC 07-12, 2003
作者:  He, ZW;  Zhen, CM;  Liu, XQ;  Lan, W;  Xu, DY
收藏  |  浏览/下载：1/0  |  提交时间：2015/07/31

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