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A novel ellipsometer for measuring thickness of oxide layer on the surface of silicon sphere - art. no. 683443 会议论文
OPTICAL DESIGN AND TESTING III, PTS 1 AND 2, Conference on Optical Design and Testing III, Beijing, PEOPLES R CHINA, Web of Science
Zhang, Jitao; Li, Yan
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Distribution system fault diagnosis based on improved rough sets with uncertainty 会议论文
Advances in Neural Networks - ISNN 2007, Pt 3, Proceedings, 4th International Symposium on Neural Networks (ISNN 2007), Nanjing, PEOPLES R CHINA, Web of Science, INSPEC
Dai, Jing; Sun, Qiuye
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A novel ellipsometer for measuring thickness of oxide layer on the surface of silicon sphere 会议论文
Proceedings of the SPIE - The International Society for Optical Engineering, Optical Design and Testing III, Beijing, China, INSPEC
Jitao Zhang; Yan Li
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