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Metal Floating Gate Memory Device With SiO2/HfO2 Dual-Layer as Engineered Tunneling Barrier 期刊论文
IEEE ELECTRON DEVICE LETTERS, 2014, 卷号: 35, 期号: 7, 页码: 744-746
作者:  Chen, GX;  Huo, ZL;  Jin, L;  Han, YL;  Li, XK
收藏  |  浏览/下载:7/0  |  提交时间:2015/05/25
Write-Once-Read-Many-Times Memory Based on ZnO on p-Si for Long-Time Archival Storage 期刊论文
IEEE ELECTRON DEVICE LETTERS, 2011, 卷号: 32, 期号: 10, 页码: 1445-1447
作者:  Qi, J;  Zhang, Q;  Huang, J;  Ren, JJ;  Olmedo, M
收藏  |  浏览/下载:3/0  |  提交时间:2015/05/25
Reset Instability in Cu/ZrO2:Cu/Pt RRAM Device 期刊论文
IEEE ELECTRON DEVICE LETTERS, 2011, 卷号: 32, 期号: 3, 页码: 363-365
作者:  Li, YT;  Long, SB;  Lv, HB;  Liu, Q;  Wang, W
收藏  |  浏览/下载:5/0  |  提交时间:2015/05/25
Highly Stable Radiation-Hardened Resistive-Switching Memory 期刊论文
IEEE ELECTRON DEVICE LETTERS, 2010, 卷号: 31, 期号: 12, 页码: 1470-1472
作者:  Wang, Y;  Lv, HB;  Wang, W;  Liu, Q;  Long, SB
收藏  |  浏览/下载:4/0  |  提交时间:2015/05/25
Resistive Switching Properties of Au/ZrO2/Ag Structure for Low-Voltage Nonvolatile Memory Applications 期刊论文
IEEE ELECTRON DEVICE LETTERS, 2010, 卷号: 31, 期号: 2, 页码: 117-119
作者:  Li, YT;  Long, SB;  Zhang, MH;  Liu, Q;  Shao, LB
收藏  |  浏览/下载:5/0  |  提交时间:2015/05/25


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