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浏览/检索结果: 共3条，第1-3条 帮助 限定条件 学科主题：半导体材料     已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 Microscopic study on the carrier distribution in optoelectronic device structures: Experiment and modeling 期刊论文 proceedings of spie- the international society for optical engineering, 2011, 卷号: 8308, 页码: 83081y Huang, Wenchao; Xia, Hui; Wang, Shaowei; Deng, Honghai; Wei, Peng; Li, Lu; Liu, Fengqi; Li, Zhifeng; Li, Tianxin 收藏  |  浏览/下载：20/0  |  提交时间：2012/06/14 Capacitance  Carrier concentration  Characterization  Diffusion  Optoelectronic devices  Photodetectors  Scanning  Semiconductor device structures  Semiconductor devices  Semiconductor quantum wells  Thermionic emission   Fermi-Level Pinning at Metal/High-k Interface Influenced by Electron State Density of Metal Gate 期刊论文 ieee electron device letters, 2010, 卷号: 31, 期号: 10, 页码: 1101-1103 Yang ZC (Yang Z. C.); Huang AP (Huang A. P.); Zheng XH (Zheng X. H.); Xiao ZS (Xiao Z. S.); Liu XY (Liu X. Y.); Zhang XW (Zhang X. W.); Chu PK (Chu Paul K.); Wang WW (Wang W. W.) 收藏  |  浏览/下载：62/0  |  提交时间：2010/11/14 Electron state density  Fermi-level pinning (FLP)  MIS structures  work function (WF)  WORK FUNCTION   High-quality metamorphic HEMT grown on GaAs substrates by MBE 会议论文 11th international conference on molecular beam epitaxy (mbe-xi), beijing, peoples r china, sep 11-15, 2000 Zeng YP; Cao X; Cui LJ; Kong MY; Pan L; Wang BQ; Zhu ZP 收藏  |  浏览/下载：8/0  |  提交时间：2010/11/15 molecular beam epitaxy  high electron mobility transistors  DENSITY