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浏览/检索结果: 共5条，第1-5条 帮助 限定条件 发表日期：2019    专题：金属研究所    第一署名单位    第一作者单位    通讯作者单位     已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 One-pot solvothermal synthesis of Fe/Fe3O4 composites with broadband microwave absorption 期刊论文 JOURNAL OF ALLOYS AND COMPOUNDS, 2019, 卷号: 803, 页码: 818-825 作者:  Wang, Xiaolei;  Geng, Qiyao;  Shi, Guimei;  Xu, Ge;  Yu, Jin 收藏  |  浏览/下载：23/0  |  提交时间：2021/02/02 Solvothermal synthesis  Fe/Fe3O4  Diploe polarization  Interfacial polarization  Impedance matching  Wide-frequency   One-pot solvothermal synthesis of Fe/Fe3O4 composites with broadband microwave absorption 期刊论文 JOURNAL OF ALLOYS AND COMPOUNDS, 2019, 卷号: 803, 页码: 818-825 作者:  Wang, Xiaolei;  Geng, Qiyao;  Shi, Guimei;  Xu, Ge;  Yu, Jin 收藏  |  浏览/下载：16/0  |  提交时间：2021/02/02 Solvothermal synthesis  Fe/Fe3O4  Diploe polarization  Interfacial polarization  Impedance matching  Wide-frequency   Characterizing the interactions of edge dislocation dipole in hexagonal close packed Ti-Al alloys 期刊论文 MATERIALS & DESIGN, 2019, 卷号: 164, 页码: 7 作者:  Wu, Hao;  Leng, Jinfeng;  Teng, Xinying;  Su, Tao;  Li, Qinggang 收藏  |  浏览/下载：9/0  |  提交时间：2021/02/02 Titanium alloys  Homogenization/solutionization  Strengthening  Crystal defects  High-resolution electron microscopy (HREM)   Characterizing the interactions of edge dislocation dipole in hexagonal close packed Ti-Al alloys 期刊论文 MATERIALS & DESIGN, 2019, 卷号: 164, 页码: 7 作者:  Wu, Hao;  Leng, Jinfeng;  Teng, Xinying;  Su, Tao;  Li, Qinggang 收藏  |  浏览/下载：13/0  |  提交时间：2021/02/02 Titanium alloys  Homogenization/solutionization  Strengthening  Crystal defects  High-resolution electron microscopy (HREM)   Characterizing the interactions of edge dislocation dipole in hexagonal close packed Ti-Al alloys 期刊论文 MATERIALS & DESIGN, 2019, 卷号: 164, 页码: 7 作者:  Wu, Hao;  Leng, Jinfeng;  Teng, Xinying;  Su, Tao;  Li, Qinggang 收藏  |  浏览/下载：1/0  |  提交时间：2021/02/02 Titanium alloys  Homogenization/solutionization  Strengthening  Crystal defects  High-resolution electron microscopy (HREM)