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浏览/检索结果: 共6条，第1-6条 帮助 限定条件 发表日期：2016    专题：北京大学    第一署名单位    第一作者单位    通讯作者单位     已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 Genetically Encoded Photocrosslinkers for Identifying and Mapping Protein-Protein Interactions in Living Cells 期刊论文 IUBMB LIFE, 2016 Yang, Yi; Song, Haiping; Chen, Peng R. 收藏  |  浏览/下载：3/0  |  提交时间：2017/12/04 photocrosslinker  genetic code expansion  protein-protein interactions  interaction dynamics  interaction interface  PHOTO-CROSS-LINKING  TRANSFER-RNA SYNTHETASE  PHOTOREACTIVE AMINO-ACID  MASS-SPECTROMETRY  ESCHERICHIA-COLI  MAMMALIAN-CELLS  CODE  LIPOPOLYSACCHARIDE  COMPLEXES  PHENYLALANINE   Two coupled one-atom lasers 期刊论文 JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS, 2016 Yu, Deshui 收藏  |  浏览/下载：4/0  |  提交时间：2017/12/03 OPTICAL LATTICE CLOCKS  ION-TRAP LASER  SINGLE-ATOM  CAVITY  RADIATION  EMISSION  PHOTONS  SYSTEM  MASER  LIGHT   Modeling of trap-assisted tunneling on performance of charge trapping memory with consideration of trap position and energy level 期刊论文 CHINESE PHYSICS B, 2016 Lun, Zhi-Yuan; Li, Yun; Zhao, Kai; Du, Gang; Liu, Xiao-Yan; Wang, Yi 收藏  |  浏览/下载：5/0  |  提交时间：2017/12/04 trap assisted tunneling  charge trapping memory  tunneling oxide degradation  NAND FLASH MEMORY  SIMULATION  SILC   Modeling of trap-assisted tunneling on performance of charge trapping memory with consideration of trap position and energy level 期刊论文 Chinese Physics. B, 2016 Lun Zhiyuan; Li Yun; Zhao Kai; Du Gang; Liu Xiaoyan; Wang Yi 收藏  |  浏览/下载：4/0  |  提交时间：2017/12/03 trap assisted tunneling  charge trapping memory  tunneling oxide degradation   High Performance Metal-Gate/High-kappa GaN MOSFET With Good Reliability for Both Logic and Power Applications 期刊论文 IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY, 2016 Yi, Shih-Han; Ruan, Dun-Bao; Di, Shaoyan; Liu, Xiaoyan; Wu, Yung Hsien; Chin, Albert 收藏  |  浏览/下载：8/0  |  提交时间：2017/12/04 GaN  MOSFET  high-kappa  reliability  interface  ELECTRON-MOBILITY TRANSISTORS  INSULATOR   Study of impact of LATID on HCI reliability for LDMOS devices 其他 2016-01-01 Chandrashekhar; Sheu, Gene; Yang, Shao Ming; Chien, Ting Yao; Lin, Yun Jung; Wu, Chieh Chih; Lee, Tzu Chieh 收藏  |  浏览/下载：6/0  |  提交时间：2017/12/03 HOT-CARRIER RELIABILITY  DEGRADATION  TRANSISTORS  MOSFET