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Azimuthal dependence of single-event and multiple-bit upsets in SRAM devices with anisotropic layout 期刊论文
NUCLEAR SCIENCE AND TECHNIQUES, 2015, 卷号: 26, 页码: 7
作者:  Duan Jing-Lai;  En Yun-Fei;  Xi Kai;  Mo Dan;  Luo Jie
收藏  |  浏览/下载:14/0  |  提交时间:2018/05/31


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