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Characterization of Leakage and Reliability of SiNx Gate Dielectric by Low-Pressure Chemical Vapor Deposition for GaN-based MIS-HEMTs 期刊论文
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2015, 卷号: 62, 期号: 10, 页码: 8
作者:  Hua, MY;  Liu, C;  Yang, S;  Liu, SH;  Fu, K
收藏  |  浏览/下载:32/0  |  提交时间:2015/12/31
Effects of rapid thermal annealing on the properties of aln films deposited by peald on algan/gan heterostructures 期刊论文
Rsc advances, 2015, 卷号: 5, 期号: 47, 页码: 37881-37886
作者:  Cao, Duo;  Cheng, Xinhong;  Xie, Ya-Hong;  Zheng, Li;  Wang, Zhongjian
收藏  |  浏览/下载:46/0  |  提交时间:2019/05/10
Theoretical study of the anisotropic electron scattering by steps in vicinal AlGaN/GaN heterostructures 期刊论文
physica e: low-dimensional systems and nanostructures, 2015, 卷号: 66, 页码: 116-119
Huijie Li; Guipeng Liu; Guijuan Zhao; Hongyuan Wei; Lianshan Wang; Shaoyan Yang; Zhen Chen; Zhanguo Wang
收藏  |  浏览/下载:19/0  |  提交时间:2016/03/29


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