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Accurate determination of electronic transport properties of silicon wafers by nonlinear photocarrier radiometry with multiple pump beam sizes 期刊论文
JOURNAL OF APPLIED PHYSICS, 2015, 卷号: 118, 期号: 21
作者:  Wang, Qian;  Li, Bincheng
收藏  |  浏览/下载:19/0  |  提交时间:2016/06/27
Electronic transport characterization of silicon wafers by spatially resolved steady-state photocarrier radiometric imaging 期刊论文
JOURNAL OF APPLIED PHYSICS, 2015, 卷号: 118, 期号: 12
作者:  Wang, Qian;  Li, Bincheng
收藏  |  浏览/下载:22/0  |  提交时间:2015/12/04
Accurate determination of electronic transport properties of silicon wafers by nonlinear photocarrier radiometry with multiple pump beam sizes 期刊论文
Journal of Applied Physics, 2015, 卷号: 118, 期号: 21, 页码: 215707
作者:  Wang, Qian;  Li, Bincheng
收藏  |  浏览/下载:13/0  |  提交时间:2016/11/21
Electronic transport characterization of silicon wafers by spatially resolved steady-state photocarrier radiometric imaging 期刊论文
Journal of Applied Physics, 2015, 卷号: 118, 期号: 12, 页码: 125705
作者:  Wang, Qian;  Li, Bincheng
收藏  |  浏览/下载:16/0  |  提交时间:2016/11/21


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