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A Wafer Level Through-Stack-Via Integration Process with One-time Bottom-up Copper Filling 其他
2014-01-01
Zhu, Yunhui; Ma, Shenglin; Sun, Xin; Fang, Runiu; Zhong, Xiao; Bian, Yuan; Guan, Yong; Chen, Jing; Miao, Min; Jin, Yufeng
收藏  |  浏览/下载:2/0  |  提交时间:2017/12/03
Modeling and analysis of TSV noise coupling and suppression methods for 20nm node and beyond 其他
2014-01-01
Fang, Runiu; Sun, Xin; Jin, Yufeng; Miao, Min
收藏  |  浏览/下载:6/0  |  提交时间:2015/11/17


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