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A novel nanoscaled device concept: Quasi-SOI MOSFET to eliminate the potential weaknesses of UTB SOI MOSFET 期刊论文
ieee电子器件汇刊, 2005
Tian, Y; Huang, R; Zhang, X; Wang, YY
收藏  |  浏览/下载:4/0  |  提交时间:2015/11/10
Scaling of lowered source/drain (LSD) and raised source/drain (RSD) ultra-thin body (UTB) SOI MOSFETs 期刊论文
固体电子学, 2005
An, X; Huang, R; Zhang, X; Wang, YY
收藏  |  浏览/下载:3/0  |  提交时间:2015/11/12
Evaluations of scaling properties for Ge on insulator MOSFETs in nano-scale 其他
2005-01-01
Du, G; Liu, XY; Xia, ZL; Wang, YK; Hou, DQ; Kang, JF; Han, RQ
收藏  |  浏览/下载:3/0  |  提交时间:2015/11/13


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