Intrinsic and quantitative effects of in-plane strain on ferroelectric properties of Mn-doped BiFeO3 epitaxial films by in situ inducing strain in substrates
Yang MM(杨明敏); Zhao XQ(赵小群); Wang J99; Zhu QX(朱秋香); 99; Li XM(李效民); Luo HS(罗豪甦); 99; 99
刊名APPLIED PHYSICS LETTERS
2014-02-03
期号104页码:052902-1
学科主题材料科学
语种英语
WOS记录号WOS:000331644100089
内容类型期刊论文
源URL[http://ir.sic.ac.cn/handle/331005/6184]  
专题上海硅酸盐研究所_无机功能材料与器件重点实验室_期刊论文
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GB/T 7714
Yang MM,Zhao XQ,Wang J99,et al. Intrinsic and quantitative effects of in-plane strain on ferroelectric properties of Mn-doped BiFeO3 epitaxial films by in situ inducing strain in substrates[J]. APPLIED PHYSICS LETTERS,2014(104):052902-1.
APA Yang MM.,Zhao XQ.,Wang J99.,Zhu QX.,99.,...&99.(2014).Intrinsic and quantitative effects of in-plane strain on ferroelectric properties of Mn-doped BiFeO3 epitaxial films by in situ inducing strain in substrates.APPLIED PHYSICS LETTERS(104),052902-1.
MLA Yang MM,et al."Intrinsic and quantitative effects of in-plane strain on ferroelectric properties of Mn-doped BiFeO3 epitaxial films by in situ inducing strain in substrates".APPLIED PHYSICS LETTERS .104(2014):052902-1.
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