Electric-field-controlled interface strain coupling and non-volatile resistance switching of La1-xBaxMnO3 thin films epitaxially grown on relaxor-based ferroelectric single crystals
Zheng M(郑明); Zhu QX(朱秋香); Li XY(李雪艳); Yang MM(杨明敏); 99; Li XM(李效民); Shi X(史迅); Luo HS(罗豪甦); Zheng RK(郑仁奎)
刊名J. Appl. Phys.
2014
卷号116期号:11页码:113911-1
学科主题无机非金属材料
语种英语
WOS记录号WOS:000342837000035
内容类型期刊论文
源URL[http://ir.sic.ac.cn/handle/331005/5915]  
专题上海硅酸盐研究所_能量转换材料重点实验室_期刊论文
推荐引用方式
GB/T 7714
Zheng M,Zhu QX,Li XY,et al. Electric-field-controlled interface strain coupling and non-volatile resistance switching of La1-xBaxMnO3 thin films epitaxially grown on relaxor-based ferroelectric single crystals[J]. J. Appl. Phys.,2014,116(11):113911-1.
APA Zheng M.,Zhu QX.,Li XY.,Yang MM.,99.,...&Zheng RK.(2014).Electric-field-controlled interface strain coupling and non-volatile resistance switching of La1-xBaxMnO3 thin films epitaxially grown on relaxor-based ferroelectric single crystals.J. Appl. Phys.,116(11),113911-1.
MLA Zheng M,et al."Electric-field-controlled interface strain coupling and non-volatile resistance switching of La1-xBaxMnO3 thin films epitaxially grown on relaxor-based ferroelectric single crystals".J. Appl. Phys. 116.11(2014):113911-1.
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