Raman identification of edge alignment of bilayer graphene down to the nanometer scale | |
Zhang, X ; Li, QQ ; Han, WP ; Lu, Y ; Shi, W ; Wu, JB ; Mikhaylushkin, AS ; Tan, PH | |
刊名 | nanoscale |
2014 | |
卷号 | 6期号:13页码:7519-7525 |
学科主题 | 半导体物理 |
收录类别 | SCI |
语种 | 英语 |
公开日期 | 2015-05-11 |
内容类型 | 期刊论文 |
源URL | [http://ir.semi.ac.cn/handle/172111/26438] |
专题 | 半导体研究所_半导体超晶格国家重点实验室 |
推荐引用方式 GB/T 7714 | Zhang, X,Li, QQ,Han, WP,et al. Raman identification of edge alignment of bilayer graphene down to the nanometer scale[J]. nanoscale,2014,6(13):7519-7525. |
APA | Zhang, X.,Li, QQ.,Han, WP.,Lu, Y.,Shi, W.,...&Tan, PH.(2014).Raman identification of edge alignment of bilayer graphene down to the nanometer scale.nanoscale,6(13),7519-7525. |
MLA | Zhang, X,et al."Raman identification of edge alignment of bilayer graphene down to the nanometer scale".nanoscale 6.13(2014):7519-7525. |
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