Determination of the Interface States in AmorphousCrystalline Silicon Using Surface Photovoltage Spectroscopy

	Determination of the Interface States in AmorphousCrystalline Silicon Using Surface Photovoltage Spectroscopy
	Li, Hao ; Zeng, Xiangbo ; Yang, Ping ; Zhang, Xiaodong ; Xie, Xiaobing ; Li, Jingyan ; Wang, Qiming
刊名	ieee electron device letters
	2013
卷号	34 期号:9 页码:1079-1081
学科主题	光电子学
收录类别	SCI
语种	英语
公开日期	2014-04-04
内容类型	期刊论文
源URL	[http://ir.semi.ac.cn/handle/172111/24656]
专题	半导体研究所_光电子研究发展中心
推荐引用方式 GB/T 7714	Li, Hao,Zeng, Xiangbo,Yang, Ping,et al. Determination of the Interface States in AmorphousCrystalline Silicon Using Surface Photovoltage Spectroscopy[J]. ieee electron device letters,2013,34(9):1079-1081.
APA	Li, Hao.,Zeng, Xiangbo.,Yang, Ping.,Zhang, Xiaodong.,Xie, Xiaobing.,...&Wang, Qiming.(2013).Determination of the Interface States in AmorphousCrystalline Silicon Using Surface Photovoltage Spectroscopy.ieee electron device letters,34(9),1079-1081.
MLA	Li, Hao,et al."Determination of the Interface States in AmorphousCrystalline Silicon Using Surface Photovoltage Spectroscopy".ieee electron device letters 34.9(2013):1079-1081.