STRUCTURAL PERFECTION IN PHYSISORBED FILMS - A SYNCHROTRON X-RAY-DIFFRACTION STUDY OF XENON ADSORBED ON THE AG(111) SURFACE

	STRUCTURAL PERFECTION IN PHYSISORBED FILMS - A SYNCHROTRON X-RAY-DIFFRACTION STUDY OF XENON ADSORBED ON THE AG(111) SURFACE
	DAI, P ; ANGOT, T ; EHRLICH, SN ; WANG, SK ; TAUB, H
刊名	PHYSICAL REVIEW LETTERS
	1994
卷号	72 期号:5 页码:685
关键词	INELASTIC HELIUM SCATTERING ORDERED AR GROWTH MULTILAYERS MONOLAYER GRAPHITE KR
ISSN号	0031-9007
通讯作者	DAI, P (reprint author), UNIV MISSOURI,DEPT PHYS & ASTRON,COLUMBIA,MO 65211, USA.
中文摘要	Synchrotron x-ray scattering has been used to investigate the structure and growth of xenon films physisorbed on the Ag(111) surface. For growth under quasiequilibrium conditions, the bulk Xe-Xe spacing is reached;at monolayer completion and fcc films of thickness greater-than-or-equal-to 220 angstrom are observed. Under kinetic growth conditions, intensity oscillations in the specular reflectivity as a function of time demonstrate nearly layer-by-layer growth. Modeling of the intensity at a fixed coverage allows profiling of the Xe/vacuum interface as well as a direct determination of the film's thickness and layer spacings.
收录类别	SCI
语种	英语
公开日期	2014-02-20
内容类型	期刊论文
源URL	[http://ir.iphy.ac.cn/handle/311004/57919]
专题	物理研究所_所内人员在其他单位发表论文题录信息_所内人员在其他单位发表论文题录信息_期刊论文
推荐引用方式 GB/T 7714	DAI, P,ANGOT, T,EHRLICH, SN,et al. STRUCTURAL PERFECTION IN PHYSISORBED FILMS - A SYNCHROTRON X-RAY-DIFFRACTION STUDY OF XENON ADSORBED ON THE AG(111) SURFACE[J]. PHYSICAL REVIEW LETTERS,1994,72(5):685.
APA	DAI, P,ANGOT, T,EHRLICH, SN,WANG, SK,&TAUB, H.(1994).STRUCTURAL PERFECTION IN PHYSISORBED FILMS - A SYNCHROTRON X-RAY-DIFFRACTION STUDY OF XENON ADSORBED ON THE AG(111) SURFACE.PHYSICAL REVIEW LETTERS,72(5),685.
MLA	DAI, P,et al."STRUCTURAL PERFECTION IN PHYSISORBED FILMS - A SYNCHROTRON X-RAY-DIFFRACTION STUDY OF XENON ADSORBED ON THE AG(111) SURFACE".PHYSICAL REVIEW LETTERS 72.5(1994):685.