Influence of the dynamic lattice strain on the transport behavior of oxide heterojunctions | |
Wang, J ; Hu, FX ; Chen, L ; Zhao, YY ; Lu, HX ; Sun, JR ; Shen, BG | |
刊名 | APPLIED PHYSICS LETTERS |
2013 | |
卷号 | 102期号:2 |
ISSN号 | 0003-6951 |
通讯作者 | Wang, J (reprint author), Chinese Acad Sci, Inst Phys, State Key Lab Magnetism, Beijing 100190, Peoples R China. |
中文摘要 | All-perovskite oxide heterojunctions composed of electron-doped titanate LaxSr1-xTiO3 (x = 0.1, 0.15) and hole-doped manganite La0.67Ca0.33MnO3 films were fabricated on piezoelectric substrate of (001)-0.7Pb(Mg1/3Nb2/3)O-3-0.3PbTiO(3) (PMN-PT). Taking advantage of the excellent converse piezoelectric effect of PMN-PT, we investigated the influence of the dynamic lattice strain on transport properties of the heterojunctions by applying external bias electric fields on the PMN-PT substrate. Photovoltaic experiments were carried out to characterize the interfacial barrier of the heterojunction. A linear reduction in the barrier height was observed with the increase of the bias field applied on PMN-PT. The value of the barrier height reduces from similar to 1.55 (similar to 1.30) to 1.02 (1.08) eV as the bias field increases from 0 to 12 kV/cm for the junction of La0.10Sr0.9TiO3/La0.67Ca0.33MnO3 (La0.15Sr0.85TiO3/La0.67Ca0.33MnO3). The observed dependency of barrier height on external field can be ascribed to the increasing release of trapped carriers by strain modulation, which results in a suppression of the depletion layer and increases the opportunity for electron tunneling across the depletion area. (C) 2013 American Institute of Physics. [http://dx.doi.org/10.1063/1.4788731] |
资助信息 | National Basic Research program of China (973 program); National Natural Science Foundation of China; Hi-Tech Research and Development program of China; Key Research Program of the Chinese Academy of Sciences |
语种 | 英语 |
公开日期 | 2014-01-16 |
内容类型 | 期刊论文 |
源URL | [http://ir.iphy.ac.cn/handle/311004/57115] |
专题 | 物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文 |
推荐引用方式 GB/T 7714 | Wang, J,Hu, FX,Chen, L,et al. Influence of the dynamic lattice strain on the transport behavior of oxide heterojunctions[J]. APPLIED PHYSICS LETTERS,2013,102(2). |
APA | Wang, J.,Hu, FX.,Chen, L.,Zhao, YY.,Lu, HX.,...&Shen, BG.(2013).Influence of the dynamic lattice strain on the transport behavior of oxide heterojunctions.APPLIED PHYSICS LETTERS,102(2). |
MLA | Wang, J,et al."Influence of the dynamic lattice strain on the transport behavior of oxide heterojunctions".APPLIED PHYSICS LETTERS 102.2(2013). |
个性服务 |
查看访问统计 |
相关权益政策 |
暂无数据 |
收藏/分享 |
除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。
修改评论