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Large enhancement of Kerr rotation in MnBixAl0.15 (0.4 <= x < 0.7) thin films
Zhu, T ; Wang, YJ
刊名JOURNAL OF PHYSICS D-APPLIED PHYSICS
1999
卷号32期号:16页码:1997
关键词MAGNETOOPTICAL PROPERTIES ELECTRONIC-STRUCTURE ALLOY-FILMS MNBI
ISSN号0022-3727
通讯作者Zhu, T: Chinese Acad Sci, Inst Phys, State Key Lab Magnetism, POB 603, Beijing 100080, Peoples R China.
中文摘要MnBixAl0.15 (0.4 less than or equal to x less than or equal to 0.9) thin films with an Al protective layer have been prepared using e-beam evaporation. The Ken rotation as a function of the Bi concentration, x, has been investigated. Compared with MnBix thin films, it is found that a large enhancement of Ken rotation appears in the MnBixAl0.15 thin films with 0.4 less than or equal to x < 0.7, but no enhancement of Ken rotation appears when x is greater than 0.7. When x = 0.5, a maximum Ken rotation of 2.75 degrees is observed at 633 nm for the MnBi0.5Al0.15 thin film, which is much larger than that of 1.56 degrees for the MnBi0.5 thin film. The possible reason for the enhancement of Ken rotation is discussed.
收录类别SCI
语种英语
公开日期2013-09-18
内容类型期刊论文
源URL[http://ir.iphy.ac.cn/handle/311004/40588]  
专题物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文
推荐引用方式
GB/T 7714
Zhu, T,Wang, YJ. Large enhancement of Kerr rotation in MnBixAl0.15 (0.4 <= x < 0.7) thin films[J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS,1999,32(16):1997.
APA Zhu, T,&Wang, YJ.(1999).Large enhancement of Kerr rotation in MnBixAl0.15 (0.4 <= x < 0.7) thin films.JOURNAL OF PHYSICS D-APPLIED PHYSICS,32(16),1997.
MLA Zhu, T,et al."Large enhancement of Kerr rotation in MnBixAl0.15 (0.4 <= x < 0.7) thin films".JOURNAL OF PHYSICS D-APPLIED PHYSICS 32.16(1999):1997.
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