Imaging ultrafast evolution of subwavelength-sized topography using single-probe structured light microscopy

doi:10.1364/prj.458613

CORC > 长春光学精密机械与物理研究所 > 中国科学院长春光学精密机械与物理研究所

	Imaging ultrafast evolution of subwavelength-sized topography using single-probe structured light microscopy
	J. Xu; C. J. Min; Y. Q. Zhang; J. L. Ni; G. W. Cao; Q. Y. Wei; J. J. Yang and X. C. Yuan
刊名	Photonics Research
	2022
卷号	10 期号:8 页码:1900-1908
ISSN号	2327-9125
DOI	10.1364/prj.458613
英文摘要	Imaging ultrafast processes in femtosecond (fs) laser-material interactions such as fs laser ablation is very important to understand the physical mechanisms involved. To achieve this goal with high resolutions in both spatial and temporal domains, a combination of optical pump-probe microscopy and structured illumination microscopy can be a promising approach, but suffers from the multiple-frame method with a phase shift that is inapplicable to irreversible ultrafast processes such as ablation. Here, we propose and build a wide-field single-probe structured light microscopy (SPSLM) to image the ultrafast three-dimensional topography evolution induced by fs lasers, where only a single imaging frame with a single structured probe pulse is required for topography reconstruction, benefiting from Fourier transform profilometry. The second harmonic of the fs laser is used as the structured probe light to improve spatial lateral resolution into the subwavelength region of similar to 478 nm, and the spatial axial and temporal resolutions are estimated to be similar to 22 nm and similar to 256 fs, respectively. With SPSLM, we successfully image the ultrafast topography evolution of a silicon wafer surface impacted by single and multiple fs pulses. The variable formation and evolution of the laser induced periodic surface structures during an ultrashort time are visualized and analyzed. We believe that SPSLM will be a significant approach for revealing and understanding various ultrafast dynamics, especially in fs laser ablation and material science. (C) 2022 Chinese Laser Press
URL标识	查看原文
语种	英语
内容类型	期刊论文
源URL	[http://ir.ciomp.ac.cn/handle/181722/66748]
专题	中国科学院长春光学精密机械与物理研究所
推荐引用方式 GB/T 7714	J. Xu,C. J. Min,Y. Q. Zhang,et al. Imaging ultrafast evolution of subwavelength-sized topography using single-probe structured light microscopy[J]. Photonics Research,2022,10(8):1900-1908.
APA	J. Xu.,C. J. Min.,Y. Q. Zhang.,J. L. Ni.,G. W. Cao.,...&J. J. Yang and X. C. Yuan.(2022).Imaging ultrafast evolution of subwavelength-sized topography using single-probe structured light microscopy.Photonics Research,10(8),1900-1908.
MLA	J. Xu,et al."Imaging ultrafast evolution of subwavelength-sized topography using single-probe structured light microscopy".Photonics Research 10.8(2022):1900-1908.