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Wetting of Ni-based amorphous and crystalline alloys by Sn and Sn-based solders
Lin, Qiaoli2; Ye, Changsheng2; Sui, Ran1
刊名Microelectronics Reliability
2020-08-01
卷号111
关键词Amorphous alloys Binary alloys Copper alloys Lead alloys Nickel oxide Oxide films Silver alloys Ternary alloys Tin Crystalline alloys Interfacial reactivity Minimum surfaces Primary crystallization Sn-based solders Volume shrinkage Wetting balance methods Wetting mechanism
ISSN号00262714
DOI10.1016/j.microrel.2020.113722
英文摘要

Using wetting balance method, the wettability of Ni-based amorphous and crystalline alloys by Sn and Sn-based solders (Sn-0.7Cu, Sn-0.3Ag-0.7Cu, and eutectic SnPb (E-SnPb, Sn63Pb37)) was evaluated at 290–310 °C. Among these solders, Sn shows the best wettability with amorphous alloy because of the strongest interfacial reactivity for oxide film removal, and E-SnPb shows the best wettability with crystalline alloy due to the minimum surface tension of E-SnPb solder. Generally, amorphous alloys have the better wettability. At least two factors caused this situation, i.e., the relatively larger surface energy of amorphous alloy and the volume shrinkage caused by the structural relaxation and the primary crystallization during wetting. In this study, the wetting mechanism actually is the deoxideation, which includes the reaction of Sn with NiO, and the mechanical removal of the oxide film. © 2020 Elsevier Ltd

WOS研究方向Engineering ; Science & Technology - Other Topics ; Physics
语种英语
出版者Elsevier Ltd
WOS记录号WOS:000552136100021
内容类型期刊论文
源URL[http://ir.lut.edu.cn/handle/2XXMBERH/115265]  
专题材料科学与工程学院
作者单位1.Department of Materials Science and Engineering, Lanzhou Institute of Technology, No.1 Gongjiaping East Road, Lanzhou; 730050, China
2.State Key Laboratory of Advanced Processing and Recycling of Non-ferrous Metal, Lanzhou University of Technology, No.287 Langongping Road, Lanzhou; 730050, China;
推荐引用方式
GB/T 7714
Lin, Qiaoli,Ye, Changsheng,Sui, Ran. Wetting of Ni-based amorphous and crystalline alloys by Sn and Sn-based solders[J]. Microelectronics Reliability,2020,111.
APA Lin, Qiaoli,Ye, Changsheng,&Sui, Ran.(2020).Wetting of Ni-based amorphous and crystalline alloys by Sn and Sn-based solders.Microelectronics Reliability,111.
MLA Lin, Qiaoli,et al."Wetting of Ni-based amorphous and crystalline alloys by Sn and Sn-based solders".Microelectronics Reliability 111(2020).
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