Atomic mapping of structural distortions in 109 degrees domain patterned BiFeO3 thin films

doi:10.1557/jmr.2017.206

	Atomic mapping of structural distortions in 109 degrees domain patterned BiFeO3 thin films
	Wang, Wen-Yuan 1,2; Zhu, Yin-Lian 1; Tang, Yun-Long 1; Han, Meng-Jiao 1; Wang, Yu-Jia 1; Ma, Xiu-Liang 1,3
刊名	JOURNAL OF MATERIALS RESEARCH
	2017-06
卷号	32 期号:12 页码:2423-2430
ISSN号	0884-2914
DOI	10.1557/jmr.2017.206
英文摘要	Structural distortions at the nanoscale are delicately linked with many exotic properties for ferroic thin films. Based on advanced aberration corrected scanning transmission electron microscopy, we observe BiFeO3 thin films with variant tensile strain states and demonstrate at an atomic scale the interplay of intrinsic spontaneous structural distortions with external constraints. Structural parameters (the rhombohedral distortion and domain wall shear distortion) under zero (BiFeO3/GdScO3) and 1.5% (BiFeO3/PrScO3) lateral strain states are quantitatively analyzed which are suppressed within a few unit cells near the film/substrate interfaces. In particular, an interfacial layer with asymmetrical lattice distortions (enhanced and reduced out-of-plane lattice spacing) on the two sides of 109 degrees domain wall is resolved. These structural distortions near the film/substrate interface in ferroic thin films reveal intense tanglement of intrinsic distortions of BiFeO3 with external boundary conditions, which could provide new insights for the development of nanoscale ferroelectric devices.
资助项目	Key Research Program of Frontier Sciences, CAS[QYZDJ-SSW-JSC010]
WOS研究方向	Materials Science
语种	英语
出版者	CAMBRIDGE UNIV PRESS
WOS记录号	WOS:000404965300023
状态	已发表
内容类型	期刊论文
源URL	[http://119.78.100.223/handle/2XXMBERH/33257]
专题	材料科学与工程学院材料科学与工程学院_特聘教授组
通讯作者	Ma, Xiu-Liang
作者单位	1.Chinese Acad Sci, Shenyang Natl Lab Mat Sci, Inst Met Res, Shenyang 110016, Peoples R China 2.Sci & Technol Surface Phys & Chem Lab, Jiangyou 621908, Sichuan, Peoples R China 3.Lanzhou Univ Technol, Sch Mat Sci & Engn, Lanzhou 730050, Peoples R China
推荐引用方式 GB/T 7714	Wang, Wen-Yuan,Zhu, Yin-Lian,Tang, Yun-Long,et al. Atomic mapping of structural distortions in 109 degrees domain patterned BiFeO3 thin films[J]. JOURNAL OF MATERIALS RESEARCH,2017,32(12):2423-2430.
APA	Wang, Wen-Yuan,Zhu, Yin-Lian,Tang, Yun-Long,Han, Meng-Jiao,Wang, Yu-Jia,&Ma, Xiu-Liang.(2017).Atomic mapping of structural distortions in 109 degrees domain patterned BiFeO3 thin films.JOURNAL OF MATERIALS RESEARCH,32(12),2423-2430.
MLA	Wang, Wen-Yuan,et al."Atomic mapping of structural distortions in 109 degrees domain patterned BiFeO3 thin films".JOURNAL OF MATERIALS RESEARCH 32.12(2017):2423-2430.