Sub-pixel dimensional measurement algorithm based on intensity integration threshold
M. Chu,W. Huang,M. Xu,S. Jia,X. Zhang and Y. Lu
刊名OSA Continuum
2020
卷号3期号:10页码:2912-2924
ISSN号25787519
DOI10.1364/OSAC.402101
英文摘要In this paper, we proposed a sub-pixel measurement algorithm based on intensity integration threshold (IIT). The proposed method can localize the sub-pixel edges in an inexpensive way by calculating the integration of the intensity across the edge and finding the point where the integration reaches the threshold. Comparative tests show our method realized better efficiency and robustness in practical applications than other state-of-the-art algorithms. 2020 Optical Society of America under the terms of the OSA Open Access Publishing Agreement.
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内容类型期刊论文
源URL[http://ir.ciomp.ac.cn/handle/181722/64924]  
专题中国科学院长春光学精密机械与物理研究所
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M. Chu,W. Huang,M. Xu,S. Jia,X. Zhang and Y. Lu. Sub-pixel dimensional measurement algorithm based on intensity integration threshold[J]. OSA Continuum,2020,3(10):2912-2924.
APA M. Chu,W. Huang,M. Xu,S. Jia,X. Zhang and Y. Lu.(2020).Sub-pixel dimensional measurement algorithm based on intensity integration threshold.OSA Continuum,3(10),2912-2924.
MLA M. Chu,W. Huang,M. Xu,S. Jia,X. Zhang and Y. Lu."Sub-pixel dimensional measurement algorithm based on intensity integration threshold".OSA Continuum 3.10(2020):2912-2924.
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