Design, Application, and Verification of the Novel SEU Tolerant Abacus-Type Layouts

doi:10.3390/electronics10233017

	Design, Application, and Verification of the Novel SEU Tolerant Abacus-Type Layouts
	Sun, Yi 1; Li, Zhi 2; He, Ze 3; Chi, Yaqing 4
刊名	ELECTRONICS
	2021-12-01
卷号	10 期号:23 页码:11
关键词	D flip-flop double interlocked storage cell single event upset
DOI	10.3390/electronics10233017
通讯作者	Chi, Yaqing(yqchi@nudt.edu.cn)
英文摘要	Radiation tolerance improvements for advanced technologies have attracted considerable interests in space application. In this paper, the single event upset (SEU) hardened double interlocked storage cell (DICE) D-type flip-flops (DFFs) with abacus-type time-delay cell are proposed and successfully implemented in our test chips. The layout structures of two kinds of abacus-type time-delay cells are illustrated, and their hardening effectiveness are verified by our simulations and heavy ion irradiations. The systematic heavy ion experimental results show that the applied abacus-type time-delay cells can reduce the SEU cross sections of DICE DFFs significantly, and even the SEU immune is observed for the full "0" data pattern. Besides, an apparent test mode dependency of the abacus-type hardened circuits is also observed. The results indicate that the nanoscale abacus structure may be suitable for space application in harsh radiation environment.
资助项目	National Natural Science Foundation of China[61704192] ; National Natural Science Foundation of China[62004221] ; National Natural Science Foundation of China[62174180] ; National Natural Science Foundation of China[11805271]
WOS关键词	SINGLE-EVENT TRANSIENTS ; FLIP-FLOP ; SRAM CELL ; TECHNOLOGY
WOS研究方向	Computer Science ; Engineering ; Physics
语种	英语
出版者	MDPI
WOS记录号	WOS:000762147100001
资助机构	National Natural Science Foundation of China
内容类型	期刊论文
源URL	[http://119.78.100.186/handle/113462/141924]
专题	中国科学院近代物理研究所
通讯作者	Chi, Yaqing
作者单位	1.China Acad Space Technol, China Aerosp Components Engn Ctr, Beijing 100028, Peoples R China 2.China Acad Space Technol, Beijing Inst Control Engn, Beijing 100190, Peoples R China 3.Chinese Acad Sci, Inst Modern Phys, Lanzhou 730000, Peoples R China 4.Natl Univ Def Technol, Coll Comp, Changsha 410000, Peoples R China
推荐引用方式 GB/T 7714	Sun, Yi,Li, Zhi,He, Ze,et al. Design, Application, and Verification of the Novel SEU Tolerant Abacus-Type Layouts[J]. ELECTRONICS,2021,10(23):11.
APA	Sun, Yi,Li, Zhi,He, Ze,&Chi, Yaqing.(2021).Design, Application, and Verification of the Novel SEU Tolerant Abacus-Type Layouts.ELECTRONICS,10(23),11.
MLA	Sun, Yi,et al."Design, Application, and Verification of the Novel SEU Tolerant Abacus-Type Layouts".ELECTRONICS 10.23(2021):11.